Engineering Materials Characterization /

Engineering Materials Characterization / / Kaushik Kumar, Divya Zindani.

Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, includ...

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VerfasserIn:
Kumar, Kaushik,
Zindani, Divya,
Place / Publishing House:Berlin ;, Boston : : De Gruyter, , [2023]
©2024
Year of Publication:2023
Language:English
Series:De Gruyter STEM
Online Access:
Physical Description:1 online resource (XVIII, 252 p.)
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id 9783110997590
ctrlnum (DE-B1597)633060
collection bib_alma
record_format marc
spelling Kumar, Kaushik, author. aut http://id.loc.gov/vocabulary/relators/aut
Engineering Materials Characterization / Kaushik Kumar, Divya Zindani.
Berlin ; Boston : De Gruyter, [2023]
©2024
1 online resource (XVIII, 252 p.)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
text file PDF rda
De Gruyter STEM
Frontmatter -- Preface -- Contents -- Part A: Microscopic instruments -- Chapter 1 Optical microscopy -- Chapter 2 Transmission electron microscopy -- Chapter 3 Scanning electron microscope -- Chapter 4 Scanning probe microscopy -- Chapter 5 X-ray diffraction analysis -- Part B: Spectroscopic instruments -- Chapter 6 Fourier transform infrared (FT-IR) spectrometer -- Chapter 7 Raman spectrometer -- Chapter 8 X-ray photoelectron spectroscopy -- Chapter 9 Ultraviolet photoelectron spectroscopy -- Chapter 10 Fluorescence spectroscopy -- Chapter 11 Nuclear magnetic resonance spectroscopy -- References -- Index
restricted access http://purl.org/coar/access_right/c_16ec online access with authorization star
Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy.
Issued also in print.
Mode of access: Internet via World Wide Web.
In English.
Description based on online resource; title from PDF title page (publisher's Web site, viewed 01. Dez 2023)
Analyrische Chemie.
Materialwissenschaften.
Spektroskopie.
Werkstoffwissenschaften.
Technology & Engineering / Materials Science / General. bisacsh
Analytical Chemsity.
Composites.
Engineering Materials.
Material Characterization.
Metals and Alloys.
Microscopy.
Spectroscopy.
Zindani, Divya, author. aut http://id.loc.gov/vocabulary/relators/aut
EPUB 9783110986464
print 9783110997606
https://doi.org/10.1515/9783110997590
https://www.degruyter.com/isbn/9783110997590
Cover https://www.degruyter.com/document/cover/isbn/9783110997590/original
language English
format eBook
author Kumar, Kaushik,
Kumar, Kaushik,
Zindani, Divya,
spellingShingle Kumar, Kaushik,
Kumar, Kaushik,
Zindani, Divya,
Engineering Materials Characterization /
De Gruyter STEM
Frontmatter --
Preface --
Contents --
Part A: Microscopic instruments --
Chapter 1 Optical microscopy --
Chapter 2 Transmission electron microscopy --
Chapter 3 Scanning electron microscope --
Chapter 4 Scanning probe microscopy --
Chapter 5 X-ray diffraction analysis --
Part B: Spectroscopic instruments --
Chapter 6 Fourier transform infrared (FT-IR) spectrometer --
Chapter 7 Raman spectrometer --
Chapter 8 X-ray photoelectron spectroscopy --
Chapter 9 Ultraviolet photoelectron spectroscopy --
Chapter 10 Fluorescence spectroscopy --
Chapter 11 Nuclear magnetic resonance spectroscopy --
References --
Index
author_facet Kumar, Kaushik,
Kumar, Kaushik,
Zindani, Divya,
Zindani, Divya,
Zindani, Divya,
author_variant k k kk
k k kk
d z dz
author_role VerfasserIn
VerfasserIn
VerfasserIn
author2 Zindani, Divya,
Zindani, Divya,
author2_variant d z dz
author2_role VerfasserIn
VerfasserIn
author_sort Kumar, Kaushik,
title Engineering Materials Characterization /
title_full Engineering Materials Characterization / Kaushik Kumar, Divya Zindani.
title_fullStr Engineering Materials Characterization / Kaushik Kumar, Divya Zindani.
title_full_unstemmed Engineering Materials Characterization / Kaushik Kumar, Divya Zindani.
title_auth Engineering Materials Characterization /
title_alt Frontmatter --
Preface --
Contents --
Part A: Microscopic instruments --
Chapter 1 Optical microscopy --
Chapter 2 Transmission electron microscopy --
Chapter 3 Scanning electron microscope --
Chapter 4 Scanning probe microscopy --
Chapter 5 X-ray diffraction analysis --
Part B: Spectroscopic instruments --
Chapter 6 Fourier transform infrared (FT-IR) spectrometer --
Chapter 7 Raman spectrometer --
Chapter 8 X-ray photoelectron spectroscopy --
Chapter 9 Ultraviolet photoelectron spectroscopy --
Chapter 10 Fluorescence spectroscopy --
Chapter 11 Nuclear magnetic resonance spectroscopy --
References --
Index
title_new Engineering Materials Characterization /
title_sort engineering materials characterization /
series De Gruyter STEM
series2 De Gruyter STEM
publisher De Gruyter,
publishDate 2023
physical 1 online resource (XVIII, 252 p.)
Issued also in print.
contents Frontmatter --
Preface --
Contents --
Part A: Microscopic instruments --
Chapter 1 Optical microscopy --
Chapter 2 Transmission electron microscopy --
Chapter 3 Scanning electron microscope --
Chapter 4 Scanning probe microscopy --
Chapter 5 X-ray diffraction analysis --
Part B: Spectroscopic instruments --
Chapter 6 Fourier transform infrared (FT-IR) spectrometer --
Chapter 7 Raman spectrometer --
Chapter 8 X-ray photoelectron spectroscopy --
Chapter 9 Ultraviolet photoelectron spectroscopy --
Chapter 10 Fluorescence spectroscopy --
Chapter 11 Nuclear magnetic resonance spectroscopy --
References --
Index
isbn 9783110997590
9783110986464
9783110997606
url https://doi.org/10.1515/9783110997590
https://www.degruyter.com/isbn/9783110997590
https://www.degruyter.com/document/cover/isbn/9783110997590/original
illustrated Not Illustrated
doi_str_mv 10.1515/9783110997590
work_keys_str_mv AT kumarkaushik engineeringmaterialscharacterization
AT zindanidivya engineeringmaterialscharacterization
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ids_txt_mv (DE-B1597)633060
carrierType_str_mv cr
is_hierarchy_title Engineering Materials Characterization /
author2_original_writing_str_mv noLinkedField
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