Engineering Materials Characterization / / Kaushik Kumar, Divya Zindani.
Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, includ...
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Place / Publishing House: | Berlin ;, Boston : : De Gruyter, , [2023] ©2024 |
Year of Publication: | 2023 |
Language: | English |
Series: | De Gruyter STEM
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Online Access: | |
Physical Description: | 1 online resource (XVIII, 252 p.) |
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LEADER | 04093nam a22007695i 4500 | ||
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001 | 9783110997590 | ||
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100 | 1 | |a Kumar, Kaushik, |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
245 | 1 | 0 | |a Engineering Materials Characterization / |c Kaushik Kumar, Divya Zindani. |
264 | 1 | |a Berlin ; |a Boston : |b De Gruyter, |c [2023] | |
264 | 4 | |c ©2024 | |
300 | |a 1 online resource (XVIII, 252 p.) | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a computer |b c |2 rdamedia | ||
338 | |a online resource |b cr |2 rdacarrier | ||
347 | |a text file |b PDF |2 rda | ||
490 | 0 | |a De Gruyter STEM | |
505 | 0 | 0 | |t Frontmatter -- |t Preface -- |t Contents -- |t Part A: Microscopic instruments -- |t Chapter 1 Optical microscopy -- |t Chapter 2 Transmission electron microscopy -- |t Chapter 3 Scanning electron microscope -- |t Chapter 4 Scanning probe microscopy -- |t Chapter 5 X-ray diffraction analysis -- |t Part B: Spectroscopic instruments -- |t Chapter 6 Fourier transform infrared (FT-IR) spectrometer -- |t Chapter 7 Raman spectrometer -- |t Chapter 8 X-ray photoelectron spectroscopy -- |t Chapter 9 Ultraviolet photoelectron spectroscopy -- |t Chapter 10 Fluorescence spectroscopy -- |t Chapter 11 Nuclear magnetic resonance spectroscopy -- |t References -- |t Index |
506 | 0 | |a restricted access |u http://purl.org/coar/access_right/c_16ec |f online access with authorization |2 star | |
520 | |a Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy. | ||
530 | |a Issued also in print. | ||
538 | |a Mode of access: Internet via World Wide Web. | ||
546 | |a In English. | ||
588 | 0 | |a Description based on online resource; title from PDF title page (publisher's Web site, viewed 01. Dez 2023) | |
650 | 4 | |a Analyrische Chemie. | |
650 | 4 | |a Materialwissenschaften. | |
650 | 4 | |a Spektroskopie. | |
650 | 4 | |a Werkstoffwissenschaften. | |
650 | 7 | |a Technology & Engineering / Materials Science / General. |2 bisacsh | |
653 | |a Analytical Chemsity. | ||
653 | |a Composites. | ||
653 | |a Engineering Materials. | ||
653 | |a Material Characterization. | ||
653 | |a Metals and Alloys. | ||
653 | |a Microscopy. | ||
653 | |a Spectroscopy. | ||
700 | 1 | |a Zindani, Divya, |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
776 | 0 | |c EPUB |z 9783110986464 | |
776 | 0 | |c print |z 9783110997606 | |
856 | 4 | 0 | |u https://doi.org/10.1515/9783110997590 |
856 | 4 | 0 | |u https://www.degruyter.com/isbn/9783110997590 |
856 | 4 | 2 | |3 Cover |u https://www.degruyter.com/document/cover/isbn/9783110997590/original |
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