Semiconductor strain metrology : principles and applications / / Terence K.S. Wong.

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Year of Publication:2012
Language:English
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Physical Description:136 p. :; ill.
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040 |a MiAaPQ  |c MiAaPQ  |d MiAaPQ 
050 4 |a TK7871.85  |b .W65 2012 
100 1 |a Wong, Terence K. S. 
245 1 0 |a Semiconductor strain metrology  |h [electronic resource] :  |b principles and applications /  |c Terence K.S. Wong. 
260 |a [Saif Zone, Sharjah, U.A.E] ;  |a Oak Park, IL :  |b Bentham Science,  |c [2012] 
300 |a 136 p. :  |b ill. 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
650 0 |a Semiconductors  |x Design and construction  |x Materials. 
650 0 |a Compound semiconductors  |x Design and construction  |x Materials. 
650 0 |a Silicon-on-insulator technology. 
655 4 |a Electronic books. 
710 2 |a ProQuest (Firm) 
856 4 0 |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=976639  |z Click to View