Electrical characterisation of ferroelectric field effect transistors based on ferroelectric HfO2 thin films / / Ekaterina Yurchuk.

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Bibliographic Details
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Place / Publishing House:Berlin : : Logos Verlag,, [2015]
Year of Publication:2015
Language:English
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Physical Description:1 online resource (x, 170 pages)
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ISBN:9783832540036
9783832594787 (ebook)
Hierarchical level:Monograph
Statement of Responsibility: Ekaterina Yurchuk.