Leakage current and defect characterization of short channel MOSFETs /

Leakage current and defect characterization of short channel MOSFETs / / Guntrade Roll.

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VerfasserIn:
Roll, Guntrade,
Place / Publishing House:Berlin : : Logos Verlag Berlin,, [2014]
2014
Year of Publication:2014
Language:English
Series:Research at NaMLab ; 2
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Physical Description:1 online resource (242 pages).
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id 5005223913
ctrlnum (MiAaPQ)5005223913
(Au-PeEL)EBL5223913
(CaPaEBR)ebr11539620
(OCoLC)1021809289
collection bib_alma
record_format marc
spelling Roll, Guntrade, author.
Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll.
Berlin : Logos Verlag Berlin, [2014]
2014
1 online resource (242 pages).
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Research at NaMLab ; 2
Description based on print version record.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Metal oxide semiconductor field-effect transistors.
Electronic books.
Print version: Roll, Guntrade. Leakage current and defect characterization of short channel MOSFETs. Berlin : Logos Verlag Berlin, c2014 242 pages Research at NaMLab ; 2 9783832532611
ProQuest (Firm)
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=5223913 Click to View
language English
format eBook
author Roll, Guntrade,
spellingShingle Roll, Guntrade,
Leakage current and defect characterization of short channel MOSFETs /
Research at NaMLab ;
author_facet Roll, Guntrade,
author_variant g r gr
author_role VerfasserIn
author_sort Roll, Guntrade,
title Leakage current and defect characterization of short channel MOSFETs /
title_full Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll.
title_fullStr Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll.
title_full_unstemmed Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll.
title_auth Leakage current and defect characterization of short channel MOSFETs /
title_new Leakage current and defect characterization of short channel MOSFETs /
title_sort leakage current and defect characterization of short channel mosfets /
series Research at NaMLab ;
series2 Research at NaMLab ;
publisher Logos Verlag Berlin,
publishDate 2014
physical 1 online resource (242 pages).
isbn 9783832596668
9783832532611
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7871
callnumber-sort TK 47871.95 R655 42014
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=5223913
illustrated Not Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.3815284
dewey-sort 3621.3815284
dewey-raw 621.3815284
dewey-search 621.3815284
oclc_num 1021809289
work_keys_str_mv AT rollguntrade leakagecurrentanddefectcharacterizationofshortchannelmosfets
status_str n
ids_txt_mv (MiAaPQ)5005223913
(Au-PeEL)EBL5223913
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carrierType_str_mv cr
is_hierarchy_title Leakage current and defect characterization of short channel MOSFETs /
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