Leakage current and defect characterization of short channel MOSFETs / / Guntrade Roll.
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Place / Publishing House: | Berlin : : Logos Verlag Berlin,, [2014] 2014 |
Year of Publication: | 2014 |
Language: | English |
Series: | Research at NaMLab ;
2 |
Online Access: | |
Physical Description: | 1 online resource (242 pages). |
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(MiAaPQ)5005223913 (Au-PeEL)EBL5223913 (CaPaEBR)ebr11539620 (OCoLC)1021809289 |
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Roll, Guntrade, author. Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll. Berlin : Logos Verlag Berlin, [2014] 2014 1 online resource (242 pages). text txt rdacontent computer c rdamedia online resource cr rdacarrier Research at NaMLab ; 2 Description based on print version record. Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Metal oxide semiconductor field-effect transistors. Electronic books. Print version: Roll, Guntrade. Leakage current and defect characterization of short channel MOSFETs. Berlin : Logos Verlag Berlin, c2014 242 pages Research at NaMLab ; 2 9783832532611 ProQuest (Firm) https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=5223913 Click to View |
language |
English |
format |
eBook |
author |
Roll, Guntrade, |
spellingShingle |
Roll, Guntrade, Leakage current and defect characterization of short channel MOSFETs / Research at NaMLab ; |
author_facet |
Roll, Guntrade, |
author_variant |
g r gr |
author_role |
VerfasserIn |
author_sort |
Roll, Guntrade, |
title |
Leakage current and defect characterization of short channel MOSFETs / |
title_full |
Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll. |
title_fullStr |
Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll. |
title_full_unstemmed |
Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll. |
title_auth |
Leakage current and defect characterization of short channel MOSFETs / |
title_new |
Leakage current and defect characterization of short channel MOSFETs / |
title_sort |
leakage current and defect characterization of short channel mosfets / |
series |
Research at NaMLab ; |
series2 |
Research at NaMLab ; |
publisher |
Logos Verlag Berlin, |
publishDate |
2014 |
physical |
1 online resource (242 pages). |
isbn |
9783832596668 9783832532611 |
callnumber-first |
T - Technology |
callnumber-subject |
TK - Electrical and Nuclear Engineering |
callnumber-label |
TK7871 |
callnumber-sort |
TK 47871.95 R655 42014 |
genre |
Electronic books. |
genre_facet |
Electronic books. |
url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=5223913 |
illustrated |
Not Illustrated |
dewey-hundreds |
600 - Technology |
dewey-tens |
620 - Engineering |
dewey-ones |
621 - Applied physics |
dewey-full |
621.3815284 |
dewey-sort |
3621.3815284 |
dewey-raw |
621.3815284 |
dewey-search |
621.3815284 |
oclc_num |
1021809289 |
work_keys_str_mv |
AT rollguntrade leakagecurrentanddefectcharacterizationofshortchannelmosfets |
status_str |
n |
ids_txt_mv |
(MiAaPQ)5005223913 (Au-PeEL)EBL5223913 (CaPaEBR)ebr11539620 (OCoLC)1021809289 |
carrierType_str_mv |
cr |
is_hierarchy_title |
Leakage current and defect characterization of short channel MOSFETs / |
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1792330980347871233 |
fullrecord |
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