Leakage current and defect characterization of short channel MOSFETs / / Guntrade Roll.
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Place / Publishing House: | Berlin : : Logos Verlag Berlin,, [2014] 2014 |
Year of Publication: | 2014 |
Language: | English |
Series: | Research at NaMLab ;
2 |
Online Access: | |
Physical Description: | 1 online resource (242 pages). |
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001 | 5005223913 | ||
003 | MiAaPQ | ||
005 | 20200520144314.0 | ||
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007 | cr cnu|||||||| | ||
008 | 180524s2014 gw o 000 0 eng d | ||
020 | |z 9783832532611 | ||
020 | |a 9783832596668 |q (electronic bk.) | ||
035 | |a (MiAaPQ)5005223913 | ||
035 | |a (Au-PeEL)EBL5223913 | ||
035 | |a (CaPaEBR)ebr11539620 | ||
035 | |a (OCoLC)1021809289 | ||
040 | |a MiAaPQ |b eng |e rda |e pn |c MiAaPQ |d MiAaPQ | ||
050 | 4 | |a TK7871.95 |b .R655 2014 | |
082 | 0 | |a 621.3815284 |2 23 | |
100 | 1 | |a Roll, Guntrade, |e author. | |
245 | 1 | 0 | |a Leakage current and defect characterization of short channel MOSFETs / |c Guntrade Roll. |
264 | 1 | |a Berlin : |b Logos Verlag Berlin, |c [2014] | |
264 | 4 | |c 2014 | |
300 | |a 1 online resource (242 pages). | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a computer |b c |2 rdamedia | ||
338 | |a online resource |b cr |2 rdacarrier | ||
490 | 0 | |a Research at NaMLab ; |v 2 | |
588 | |a Description based on print version record. | ||
590 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
650 | 0 | |a Metal oxide semiconductor field-effect transistors. | |
655 | 4 | |a Electronic books. | |
776 | 0 | 8 | |i Print version: |a Roll, Guntrade. |t Leakage current and defect characterization of short channel MOSFETs. |d Berlin : Logos Verlag Berlin, c2014 |h 242 pages |k Research at NaMLab ; 2 |z 9783832532611 |
797 | 2 | |a ProQuest (Firm) | |
856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=5223913 |z Click to View |