High-resolution transmission electron microscopy and associated techniques / / editors, Peter R. Buseck, John M. Cowley, Leroy Eyring.
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| Place / Publishing House: | New York, New York ;, Oxford, [England] : : Oxford University Press,, 1988. 1988 |
| Year of Publication: | 1988 |
| Language: | English |
| Online Access: | |
| Physical Description: | 1 online resource (645 pages) :; illustrations |
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| 001 | 500271603 | ||
| 003 | MiAaPQ | ||
| 005 | 20200520144314.0 | ||
| 006 | m o d | | ||
| 007 | cr cnu|||||||| | ||
| 008 | 161129t19881988nyua ob 001 0 eng d | ||
| 020 | |z 9780195042757 | ||
| 020 | |a 9780195364651 |q (electronic bk.) | ||
| 035 | |a (MiAaPQ)500271603 | ||
| 035 | |a (Au-PeEL)EBL271603 | ||
| 035 | |a (CaPaEBR)ebr11303221 | ||
| 035 | |a (CaONFJC)MIL52324 | ||
| 035 | |a (OCoLC)466425385 | ||
| 040 | |a MiAaPQ |b eng |e rda |e pn |c MiAaPQ |d MiAaPQ | ||
| 050 | 4 | |a QH212.T7 |b .H544 1988 | |
| 082 | 0 | |a 502/.8/25 |2 19 | |
| 245 | 0 | 0 | |a High-resolution transmission electron microscopy and associated techniques / |c editors, Peter R. Buseck, John M. Cowley, Leroy Eyring. |
| 264 | 1 | |a New York, New York ; |a Oxford, [England] : |b Oxford University Press, |c 1988. | |
| 264 | 4 | |c 1988 | |
| 300 | |a 1 online resource (645 pages) : |b illustrations | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a computer |2 rdamedia | ||
| 338 | |a online resource |2 rdacarrier | ||
| 504 | |a Includes bibliographical references at the end of each chapters and index. | ||
| 588 | |a Description based on print version record. | ||
| 590 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Transmission electron microscopy. | |
| 655 | 4 | |a Electronic books. | |
| 700 | 1 | |a Buseck, Peter, |e editor. | |
| 700 | 1 | |a Cowley, J. M. |q (John Maxwell), |d 1923- |e editor. | |
| 700 | 1 | |a Eyring, LeRoy, |e editor. | |
| 776 | 0 | 8 | |i Print version: |t High-resolution transmission electron microscopy and associated techniques. |d New York, New York ; Oxford, [England] : Oxford University Press, c1988 |h xix, 645 pages |z 9780195042757 |w 87014701 |
| 797 | 2 | |a ProQuest (Firm) | |
| 856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=271603 |z Click to View |