Robust design of microelectronics assemblies against mechanical schock, temperature and moisture / / E-H Wong, Y.-W Mai.

Saved in:
Bibliographic Details
Superior document:Woodhead Publishing series in electronic and optical materials, number 81
VerfasserIn:
TeilnehmendeR:
Place / Publishing House:Boston, MA : : Elsevier,, [2015]
2015
Year of Publication:2015
Language:English
Series:Woodhead Publishing series in electronic and optical materials ; no 81.
Online Access:
Physical Description:1 online resource (477 pages) :; illustrations (some color).
Tags: Add Tag
No Tags, Be the first to tag this record!
id 5002056911
ctrlnum (MiAaPQ)5002056911
(Au-PeEL)EBL2056911
(CaPaEBR)ebr11058676
(CaONFJC)MIL788494
(OCoLC)910159095
collection bib_alma
record_format marc
spelling Wong, E- H., author.
Robust design of microelectronics assemblies against mechanical schock, temperature and moisture / E-H Wong, Y.-W Mai.
Boston, MA : Elsevier, [2015]
2015
1 online resource (477 pages) : illustrations (some color).
text rdacontent
computer rdamedia
online resource rdacarrier
Woodhead Publishing series in electronic and optical materials, 2050-1501 ; number 81
Includes bibliographical references and index.
Description based on print version record.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Microelectronics Design.
Industrial design.
Robust control.
Electronic books.
Mai, Y.-W., author.
Print version: Wong, E- H. Robust design of microelectronics assemblies against mechanical schock, temperature and moisture. Boston, MA : Elsevier, [2015] Woodhead Publishing series in electronic and optical materials ; number 81 9781845695286 (DLC)18461254
ProQuest (Firm)
Woodhead Publishing series in electronic and optical materials ; no 81.
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=2056911 Click to View
language English
format eBook
author Wong, E- H.,
Mai, Y.-W.,
spellingShingle Wong, E- H.,
Mai, Y.-W.,
Robust design of microelectronics assemblies against mechanical schock, temperature and moisture /
Woodhead Publishing series in electronic and optical materials,
author_facet Wong, E- H.,
Mai, Y.-W.,
Mai, Y.-W.,
author_variant e h w eh ehw
y w m ywm
author_role VerfasserIn
VerfasserIn
author2 Mai, Y.-W.,
author2_role TeilnehmendeR
author_sort Wong, E- H.,
title Robust design of microelectronics assemblies against mechanical schock, temperature and moisture /
title_full Robust design of microelectronics assemblies against mechanical schock, temperature and moisture / E-H Wong, Y.-W Mai.
title_fullStr Robust design of microelectronics assemblies against mechanical schock, temperature and moisture / E-H Wong, Y.-W Mai.
title_full_unstemmed Robust design of microelectronics assemblies against mechanical schock, temperature and moisture / E-H Wong, Y.-W Mai.
title_auth Robust design of microelectronics assemblies against mechanical schock, temperature and moisture /
title_new Robust design of microelectronics assemblies against mechanical schock, temperature and moisture /
title_sort robust design of microelectronics assemblies against mechanical schock, temperature and moisture /
series Woodhead Publishing series in electronic and optical materials,
series2 Woodhead Publishing series in electronic and optical materials,
publisher Elsevier,
publishDate 2015
physical 1 online resource (477 pages) : illustrations (some color).
isbn 9780857099112
9781845695286
issn 2050-1501 ;
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7874
callnumber-sort TK 47874 W66 42015
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=2056911
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.381046
dewey-sort 3621.381046
dewey-raw 621.381046
dewey-search 621.381046
oclc_num 910159095
work_keys_str_mv AT wongeh robustdesignofmicroelectronicsassembliesagainstmechanicalschocktemperatureandmoisture
AT maiyw robustdesignofmicroelectronicsassembliesagainstmechanicalschocktemperatureandmoisture
status_str n
ids_txt_mv (MiAaPQ)5002056911
(Au-PeEL)EBL2056911
(CaPaEBR)ebr11058676
(CaONFJC)MIL788494
(OCoLC)910159095
hierarchy_parent_title Woodhead Publishing series in electronic and optical materials, number 81
hierarchy_sequence no 81.
is_hierarchy_title Robust design of microelectronics assemblies against mechanical schock, temperature and moisture /
container_title Woodhead Publishing series in electronic and optical materials, number 81
author2_original_writing_str_mv noLinkedField
_version_ 1792330819635773440
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02082nam a2200469 i 4500</leader><controlfield tag="001">5002056911</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200909225244.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cnu||||||||</controlfield><controlfield tag="008">150123t20152015mauad ob 001 0 eng|d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9781845695286</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780857099112</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)5002056911</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL2056911</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr11058676</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL788494</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)910159095</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="e">pn</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TK7874</subfield><subfield code="b">.W66 2015</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381046</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wong, E- H.,</subfield><subfield code="e">author.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Robust design of microelectronics assemblies against mechanical schock, temperature and moisture /</subfield><subfield code="c">E-H Wong, Y.-W Mai.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA :</subfield><subfield code="b">Elsevier,</subfield><subfield code="c">[2015]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (477 pages) :</subfield><subfield code="b">illustrations (some color).</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Woodhead Publishing series in electronic and optical materials,</subfield><subfield code="x">2050-1501 ;</subfield><subfield code="v">number 81</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index.</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on print version record.</subfield></datafield><datafield tag="590" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Microelectronics</subfield><subfield code="x">Design.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Industrial design.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Robust control.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Mai, Y.-W.,</subfield><subfield code="e">author.</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="a">Wong, E- H.</subfield><subfield code="t">Robust design of microelectronics assemblies against mechanical schock, temperature and moisture.</subfield><subfield code="d">Boston, MA : Elsevier, [2015]</subfield><subfield code="k">Woodhead Publishing series in electronic and optical materials ; number 81</subfield><subfield code="z">9781845695286</subfield><subfield code="w">(DLC)18461254</subfield></datafield><datafield tag="797" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Woodhead Publishing series in electronic and optical materials ;</subfield><subfield code="v">no 81.</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=2056911</subfield><subfield code="z">Click to View</subfield></datafield></record></collection>