Reliability modeling with applications : : essays in honor of Professor Toshio Nakagawa on his 70th Birthday / / editors, Syouji Nakamura, Kinjo Gakuin University, Japan, Cun Hua Qian, Nanjing University of Technology, China, Mingchih Chen, Fe Jen Catholic University, Taiwan.
Saved in:
TeilnehmendeR: | |
---|---|
Place / Publishing House: | New Jersey : : World Scientific,, [2014] 2014 |
Year of Publication: | 2014 |
Language: | English |
Online Access: | |
Physical Description: | 1 online resource (379 pages) :; illustrations |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Be the first to leave a comment!