Reliability modeling with applications : : essays in honor of Professor Toshio Nakagawa on his 70th Birthday / / editors, Syouji Nakamura, Kinjo Gakuin University, Japan, Cun Hua Qian, Nanjing University of Technology, China, Mingchih Chen, Fe Jen Catholic University, Taiwan.

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Place / Publishing House:New Jersey : : World Scientific,, [2014]
2014
Year of Publication:2014
Language:English
Online Access:
Physical Description:1 online resource (379 pages) :; illustrations
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Description
Bibliography:Includes bibliographical references.
ISBN:9789814571937
9789814571944
Hierarchical level:Monograph
Statement of Responsibility: editors, Syouji Nakamura, Kinjo Gakuin University, Japan, Cun Hua Qian, Nanjing University of Technology, China, Mingchih Chen, Fe Jen Catholic University, Taiwan.