Scanning probe microscopy for industrial applications : : nanomechanical characterization / / edited by Dalia G. Yablon.

Saved in:
Bibliographic Details
TeilnehmendeR:
Place / Publishing House:Hoboken, New Jersey : : Wiley,, 2014.
2014
Year of Publication:2014
Language:English
Online Access:
Physical Description:1 online resource (385 pages) :; illustrations (some color), graphs
Tags: Add Tag
No Tags, Be the first to tag this record!