Scanning probe microscopy for industrial applications : : nanomechanical characterization / / edited by Dalia G. Yablon.

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TeilnehmendeR:
Place / Publishing House:Hoboken, New Jersey : : Wiley,, 2014.
2014
Year of Publication:2014
Language:English
Online Access:
Physical Description:1 online resource (385 pages) :; illustrations (some color), graphs
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id 5001483726
ctrlnum (MiAaPQ)5001483726
(Au-PeEL)EBL1483726
(CaPaEBR)ebr10788041
(CaONFJC)MIL538547
(OCoLC)868954409
collection bib_alma
record_format marc
spelling Scanning probe microscopy for industrial applications : nanomechanical characterization / edited by Dalia G. Yablon.
Hoboken, New Jersey : Wiley, 2014.
2014
1 online resource (385 pages) : illustrations (some color), graphs
text rdacontent
computer rdamedia
online resource rdacarrier
Includes bibliographical references at the end of each chapters and index.
Description based on print version record.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Materials Microscopy.
Scanning probe microscopy Industrial applications.
Electronic books.
Yablon, Dalia G., 1975-
Print version: Scanning probe microscopy for industrial applications : nanomechanical characterization. Hoboken, New Jersey : Wiley, c2014 xix, 347 pages 9781118288238 2013009638
ProQuest (Firm)
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1483726 Click to View
language English
format eBook
author2 Yablon, Dalia G., 1975-
author_facet Yablon, Dalia G., 1975-
author2_variant d g y dg dgy
author2_role TeilnehmendeR
author_sort Yablon, Dalia G., 1975-
title Scanning probe microscopy for industrial applications : nanomechanical characterization /
spellingShingle Scanning probe microscopy for industrial applications : nanomechanical characterization /
title_sub nanomechanical characterization /
title_full Scanning probe microscopy for industrial applications : nanomechanical characterization / edited by Dalia G. Yablon.
title_fullStr Scanning probe microscopy for industrial applications : nanomechanical characterization / edited by Dalia G. Yablon.
title_full_unstemmed Scanning probe microscopy for industrial applications : nanomechanical characterization / edited by Dalia G. Yablon.
title_auth Scanning probe microscopy for industrial applications : nanomechanical characterization /
title_new Scanning probe microscopy for industrial applications :
title_sort scanning probe microscopy for industrial applications : nanomechanical characterization /
publisher Wiley,
publishDate 2014
physical 1 online resource (385 pages) : illustrations (some color), graphs
isbn 9781118723142
9781118288238
callnumber-first T - Technology
callnumber-subject TA - General and Civil Engineering
callnumber-label TA417
callnumber-sort TA 3417.23 S336 42014
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1483726
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 620 - Engineering & allied operations
dewey-full 620.1/127
dewey-sort 3620.1 3127
dewey-raw 620.1/127
dewey-search 620.1/127
oclc_num 868954409
work_keys_str_mv AT yablondaliag scanningprobemicroscopyforindustrialapplicationsnanomechanicalcharacterization
status_str n
ids_txt_mv (MiAaPQ)5001483726
(Au-PeEL)EBL1483726
(CaPaEBR)ebr10788041
(CaONFJC)MIL538547
(OCoLC)868954409
is_hierarchy_title Scanning probe microscopy for industrial applications : nanomechanical characterization /
author2_original_writing_str_mv noLinkedField
_version_ 1792330761765912576
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01817nam a2200421 i 4500</leader><controlfield tag="001">5001483726</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cnu||||||||</controlfield><controlfield tag="008">131107s2014 njua ob 001 0 eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9781118288238</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118723142</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)5001483726</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL1483726</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr10788041</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL538547</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)868954409</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="e">pn</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TA417.23</subfield><subfield code="b">.S336 2014</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.1/127</subfield><subfield code="2">23</subfield></datafield><datafield tag="245" ind1="0" ind2="0"><subfield code="a">Scanning probe microscopy for industrial applications :</subfield><subfield code="b">nanomechanical characterization /</subfield><subfield code="c">edited by Dalia G. Yablon.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, New Jersey :</subfield><subfield code="b">Wiley,</subfield><subfield code="c">2014.</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">2014</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (385 pages) :</subfield><subfield code="b">illustrations (some color), graphs</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references at the end of each chapters and index.</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on print version record.</subfield></datafield><datafield tag="590" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Materials</subfield><subfield code="x">Microscopy.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Scanning probe microscopy</subfield><subfield code="x">Industrial applications.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Yablon, Dalia G.,</subfield><subfield code="d">1975-</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="t">Scanning probe microscopy for industrial applications : nanomechanical characterization.</subfield><subfield code="d">Hoboken, New Jersey : Wiley, c2014 </subfield><subfield code="h">xix, 347 pages </subfield><subfield code="z">9781118288238 </subfield><subfield code="w">2013009638</subfield></datafield><datafield tag="797" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1483726</subfield><subfield code="z">Click to View</subfield></datafield></record></collection>