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Xiaoqing Wen

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Xiaoqing Wen from the Kyushu Institute of Technology, Iizuka, Fukuoka, Japan was named Fellow of the Institute of Electrical and Electronics Engineers (IEEE) in 2012 ''for contributions to testing of integrated circuits''. Provided by Wikipedia

VLSI test principles and architectures : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

Participants: Wang, Laung-Terng. [ TeilnehmendeR ]; Wu, Cheng-Wen, EE Ph. D. [ TeilnehmendeR ]; Wen, Xiaoqing. [ TeilnehmendeR ]
Published: c2006.
Superior document: The Morgan Kaufmann series in systems on silicon

Other Authors: “...Wen, Xiaoqing....”

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