Analyzing Best Practices in Technology Education / / Marc J. de Vries; Rod Custer; John Dakers; Gene Martin.
Inspired by a similar book in science education, the editors of this volume have put together a book with a practice-oriented approach towards technology education research. Teachers’ accounts of successful classroom activities are used as the basis for reflection on what determines 'good'...
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| Superior document: | International Technology Education Studies ; 2 |
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| Place / Publishing House: | Leiden; , Boston : : Brill | Sense,, 2007. |
| Year of Publication: | 2007 |
| Language: | English |
| Series: | International Technology Education Studies ;
2. |
| Physical Description: | 1 online resource (270 pages) :; illustrations. |
| Notes: | Bibliographic Level Mode of Issuance: Monograph |
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Table of Contents:
- Preliminary Material / Marc de Vries , Rod Custer , John Dakers and Gene Martin
- Reflecting on Reflective Practitioners in Technology Education / Marc J. de Vries
- Teaching Biotechnology / Paula Wine and Judy Moreland
- Building a New Community / Diane Novak and Patrick N. Foster
- Probing our Technological Past / Kenneth Pryde
- Electronics / Tony Cox
- Construction of a Three-Phase Didactic Motor / Luis Bernardo Rios Escobar
- Mysteries for Sale / Josine E. Frederik and Wim Sonneveld
- Power and Energy / Thelma Kastl
- Puppetry as a Technology Education Unit / Swati Mehrotra and Ritesh Khunyakari
- Incorporating Technological Literacy into Classroom Practice / John R Dakers
- Ethics In Technology / Rodney L. Custer
- Culture and Technology Education / Chitra Natarajan
- Design Aspects / Robert McCormick
- Stakeholders in Technology Education / P. John Williams
- Attitudes / Kenneth S. Volk
- Motivational Aspects / Ann Marie Hill
- Teaching Approaches / Judy Moreland and Bronwen Cowie
- Social Aspects of Learning / Michael A. de Miranda
- Differentiation in the Technology Education Classroom / Marie Hoepfl
- Assessment / Richard Kimbell
- Index / Marc de Vries , Rod Custer , John Dakers and Gene Martin.