Journal of electronic testing : : theory and applications

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TeilnehmendeR:
Publication history:Began with vol. 1, no. 1 (Feb. 1990).
Language:English
Notes:Refereed/Peer-reviewed
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lccn 2004229188
ctrlnum (OCoLC)38266720
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spelling Journal of electronic testing (Online)
Journal of electronic testing (Dordrecht. Online)
Journal of electronic testing : theory and applications
1990- : [Dordrecht] : Kluwer Academic Publishers, c1990-
<2009->: [Dordrecht] : Springer Netherlands
Bimonthly
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Began with vol. 1, no. 1 (Feb. 1990).
A journal serving electronic test professionals in concurrence with the Test Technology technical council (TTTC) of the IEEE Computer Society, <2010->
Description based on: Vol. 1, no. 1 (Feb. 1990); title from journal information screen (SpringerLink, viewed Nov. 12, 2009).
Latest issue consulted: Vol. 26, no. 3 (June 2010) (viewed June 23, 2010).
Refereed/Peer-reviewed
Electronic apparatus and appliances Testing Periodicals.
Appareils électroniques Essais Périodiques.
IEEE Computer Society. Technical Council on Test Technology.
0923-8174
language English
format Journal
author2 IEEE Computer Society. Technical Council on Test Technology.
author_facet IEEE Computer Society. Technical Council on Test Technology.
IEEE Computer Society. Technical Council on Test Technology.
author2_role TeilnehmendeR
author_corporate IEEE Computer Society. Technical Council on Test Technology.
title Journal of electronic testing : theory and applications
spellingShingle Journal of electronic testing : theory and applications
title_sub theory and applications
title_full Journal of electronic testing : theory and applications
title_fullStr Journal of electronic testing : theory and applications
title_full_unstemmed Journal of electronic testing : theory and applications
title_auth Journal of electronic testing : theory and applications
title_alt Journal of electronic testing (Online)
title_new Journal of electronic testing :
title_sort journal of electronic testing : theory and applications
publisher Kluwer Academic Publishers,
Springer Netherlands
publishDate 1990
dateSpan Began with vol. 1, no. 1 (Feb. 1990).
issn 1573-0727
0923-8174
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7869
callnumber-sort TK 47869 J68
genre_facet Periodicals.
Périodiques.
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.381548
dewey-sort 3621.381548
dewey-raw 621.381548
dewey-search 621.381548
oclc_num 38266720
work_keys_str_mv UT journalofelectronictestingonline
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status_str n
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carrierType_str_mv cr
is_hierarchy_title Journal of electronic testing : theory and applications
author2_original_writing_str_mv noLinkedField
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