Journal of electronic testing : : theory and applications
Saved in:
: | |
---|---|
TeilnehmendeR: | |
Publication history: | Began with vol. 1, no. 1 (Feb. 1990). |
Language: | English |
Notes: | Refereed/Peer-reviewed |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
id |
993572147604498 |
---|---|
lccn |
2004229188 |
ctrlnum |
(OCoLC)38266720 (CKB)954925565710 (CONSER) 2004229188 (DE-599)ZDB1479776-8 (MiAaPQ)54186 (EXLCZ)99954925565710 |
collection |
bib_alma |
record_format |
marc |
spelling |
Journal of electronic testing (Online) Journal of electronic testing (Dordrecht. Online) Journal of electronic testing : theory and applications 1990- : [Dordrecht] : Kluwer Academic Publishers, c1990- <2009->: [Dordrecht] : Springer Netherlands Bimonthly text txt rdacontent computer c rdamedia online resource cr rdacarrier Began with vol. 1, no. 1 (Feb. 1990). A journal serving electronic test professionals in concurrence with the Test Technology technical council (TTTC) of the IEEE Computer Society, <2010-> Description based on: Vol. 1, no. 1 (Feb. 1990); title from journal information screen (SpringerLink, viewed Nov. 12, 2009). Latest issue consulted: Vol. 26, no. 3 (June 2010) (viewed June 23, 2010). Refereed/Peer-reviewed Electronic apparatus and appliances Testing Periodicals. Appareils électroniques Essais Périodiques. IEEE Computer Society. Technical Council on Test Technology. 0923-8174 |
language |
English |
format |
Journal |
author2 |
IEEE Computer Society. Technical Council on Test Technology. |
author_facet |
IEEE Computer Society. Technical Council on Test Technology. IEEE Computer Society. Technical Council on Test Technology. |
author2_role |
TeilnehmendeR |
author_corporate |
IEEE Computer Society. Technical Council on Test Technology. |
title |
Journal of electronic testing : theory and applications |
spellingShingle |
Journal of electronic testing : theory and applications |
title_sub |
theory and applications |
title_full |
Journal of electronic testing : theory and applications |
title_fullStr |
Journal of electronic testing : theory and applications |
title_full_unstemmed |
Journal of electronic testing : theory and applications |
title_auth |
Journal of electronic testing : theory and applications |
title_alt |
Journal of electronic testing (Online) |
title_new |
Journal of electronic testing : |
title_sort |
journal of electronic testing : theory and applications |
publisher |
Kluwer Academic Publishers, Springer Netherlands |
publishDate |
1990 |
dateSpan |
Began with vol. 1, no. 1 (Feb. 1990). |
issn |
1573-0727 0923-8174 |
callnumber-first |
T - Technology |
callnumber-subject |
TK - Electrical and Nuclear Engineering |
callnumber-label |
TK7869 |
callnumber-sort |
TK 47869 J68 |
genre_facet |
Periodicals. Périodiques. |
illustrated |
Illustrated |
dewey-hundreds |
600 - Technology |
dewey-tens |
620 - Engineering |
dewey-ones |
621 - Applied physics |
dewey-full |
621.381548 |
dewey-sort |
3621.381548 |
dewey-raw |
621.381548 |
dewey-search |
621.381548 |
oclc_num |
38266720 |
work_keys_str_mv |
UT journalofelectronictestingonline AT ieeecomputersocietytechnicalcouncilontesttechnology journalofelectronictestingtheoryandapplications |
status_str |
n |
ids_txt_mv |
(OCoLC)38266720 (CKB)954925565710 (CONSER) 2004229188 (DE-599)ZDB1479776-8 (MiAaPQ)54186 (EXLCZ)99954925565710 |
carrierType_str_mv |
cr |
is_hierarchy_title |
Journal of electronic testing : theory and applications |
author2_original_writing_str_mv |
noLinkedField |
_version_ |
1796652556584222720 |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01886nas a2200457 a 4500</leader><controlfield tag="001">993572147604498</controlfield><controlfield tag="005">20240413015830.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr#mnu</controlfield><controlfield tag="008">980126c19909999ne br poo 0 a0eng c</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a"> 2004229188</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">1479776-8</subfield><subfield code="2">DE-600</subfield></datafield><datafield tag="022" ind1=" " ind2=" "><subfield code="a">1573-0727</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)38266720</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CKB)954925565710</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CONSER) 2004229188</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)ZDB1479776-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)54186</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(EXLCZ)99954925565710</subfield></datafield><datafield tag="037" ind1=" " ind2=" "><subfield code="b">Kluwer Academic Publishers, Spuiboulevard 50, P.O. Box 17, 3300 AA Dordrecht, The Netherlands</subfield></datafield><datafield tag="042" ind1=" " ind2=" "><subfield code="a">pcc</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TK7869</subfield><subfield code="b">.J68</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">621.381548</subfield></datafield><datafield tag="130" ind1="0" ind2=" "><subfield code="a">Journal of electronic testing (Online)</subfield></datafield><datafield tag="222" ind1=" " ind2="0"><subfield code="a">Journal of electronic testing</subfield><subfield code="b">(Dordrecht. Online)</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Journal of electronic testing :</subfield><subfield code="b">theory and applications</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="3">1990- :</subfield><subfield code="a">[Dordrecht] :</subfield><subfield code="b">Kluwer Academic Publishers,</subfield><subfield code="c">c1990-</subfield></datafield><datafield tag="260" ind1="3" ind2=" "><subfield code="3"><2009->:</subfield><subfield code="a">[Dordrecht] :</subfield><subfield code="b">Springer Netherlands</subfield></datafield><datafield tag="310" ind1=" " ind2=" "><subfield code="a">Bimonthly</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="362" ind1="1" ind2=" "><subfield code="a">Began with vol. 1, no. 1 (Feb. 1990).</subfield></datafield><datafield tag="550" ind1=" " ind2=" "><subfield code="a">A journal serving electronic test professionals in concurrence with the Test Technology technical council (TTTC) of the IEEE Computer Society, <2010-></subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on: Vol. 1, no. 1 (Feb. 1990); title from journal information screen (SpringerLink, viewed Nov. 12, 2009).</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Latest issue consulted: Vol. 26, no. 3 (June 2010) (viewed June 23, 2010).</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Refereed/Peer-reviewed</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Periodicals.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Appareils électroniques</subfield><subfield code="x">Essais</subfield><subfield code="v">Périodiques.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">IEEE Computer Society.</subfield><subfield code="b">Technical Council on Test Technology.</subfield></datafield><datafield tag="776" ind1=" " ind2=" "><subfield code="x">0923-8174</subfield></datafield><datafield tag="906" ind1=" " ind2=" "><subfield code="a">JOURNAL</subfield></datafield><datafield tag="ADM" ind1=" " ind2=" "><subfield code="b">2024-04-14 02:57:36 Europe/Vienna</subfield><subfield code="f">system</subfield><subfield code="c">marc21</subfield><subfield code="a">2012-02-26 02:56:25 Europe/Vienna</subfield><subfield code="g">false</subfield></datafield><datafield tag="AVE" ind1=" " ind2=" "><subfield code="j">Im ÖAW Netz verfügbar oder Zugriff via ÖAW-Shibboteth-Login</subfield><subfield code="i">SpringerLink - AutoHoldings</subfield><subfield code="P">SpringerLink Journals - AutoHoldings</subfield><subfield code="x">https://eu02.alma.exlibrisgroup.com/view/uresolver/43ACC_OEAW/openurl?u.ignore_date_coverage=true&portfolio_pid=5341608680004498&Force_direct=true</subfield><subfield code="Z">5341608680004498</subfield><subfield code="m"> Available from 01/02/1997 volume: 10 issue: 1.</subfield><subfield code="b">Available</subfield><subfield code="8">5341608680004498</subfield></datafield><datafield tag="AVE" ind1=" " ind2=" "><subfield code="Z">5341608680004498</subfield><subfield code="A">1997</subfield><subfield code="G">10</subfield><subfield code="I">1</subfield></datafield></record></collection> |