Crystal indentation hardness / / edited by Ronald W. Armstrong, Stephen M. Walley, Wayne L. Elban.

Determinations of the indentation hardness properties of crystals have expanded to cover the full characterizations of their important elastic, plastic and cracking behaviors, particularly as accomplished with the increased measuring capabilities of nanoindentation hardness testing. No crystal struc...

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Place / Publishing House:Basel, Switzerland : : MDPI,, [2018]
©2018
Year of Publication:2018
Language:English
Physical Description:1 online resource (334 pages) :; illustrations
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id 993561934204498
ctrlnum (CKB)5400000000000611
(NjHacI)995400000000000611
(EXLCZ)995400000000000611
collection bib_alma
record_format marc
spelling Crystal indentation hardness / edited by Ronald W. Armstrong, Stephen M. Walley, Wayne L. Elban.
Basel, Switzerland : MDPI, [2018]
©2018
1 online resource (334 pages) : illustrations
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Description based on publisher supplied metadata and other sources.
Determinations of the indentation hardness properties of crystals have expanded to cover the full characterizations of their important elastic, plastic and cracking behaviors, particularly as accomplished with the increased measuring capabilities of nanoindentation hardness testing. No crystal structure of any bonding type is either too soft or too hard to prevent measurement with a suitable probing indenter. The current Special Issue is devoted to surveying the topic with emphasis given in a collection of reports to: (1) the diversity of crystals being tested; (2) the variety of measuring techniques; and (3) the wealth of information being obtained.
Includes bibliographical references.
Hardness Testing.
Armstrong, Ronald W., editor.
Walley, Stephen M., editor.
Elban, Wayne L., editor.
language English
format eBook
author2 Armstrong, Ronald W.,
Walley, Stephen M.,
Elban, Wayne L.,
author_facet Armstrong, Ronald W.,
Walley, Stephen M.,
Elban, Wayne L.,
author2_variant r w a rw rwa
s m w sm smw
w l e wl wle
author2_role TeilnehmendeR
TeilnehmendeR
TeilnehmendeR
title Crystal indentation hardness /
spellingShingle Crystal indentation hardness /
title_full Crystal indentation hardness / edited by Ronald W. Armstrong, Stephen M. Walley, Wayne L. Elban.
title_fullStr Crystal indentation hardness / edited by Ronald W. Armstrong, Stephen M. Walley, Wayne L. Elban.
title_full_unstemmed Crystal indentation hardness / edited by Ronald W. Armstrong, Stephen M. Walley, Wayne L. Elban.
title_auth Crystal indentation hardness /
title_new Crystal indentation hardness /
title_sort crystal indentation hardness /
publisher MDPI,
publishDate 2018
physical 1 online resource (334 pages) : illustrations
isbn 3-03842-968-6
callnumber-first Q - Science
callnumber-subject QE - Geology
callnumber-label QE369
callnumber-sort QE 3369 P49 C797 42018
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 620 - Engineering & allied operations
dewey-full 620.1126
dewey-sort 3620.1126
dewey-raw 620.1126
dewey-search 620.1126
work_keys_str_mv AT armstrongronaldw crystalindentationhardness
AT walleystephenm crystalindentationhardness
AT elbanwaynel crystalindentationhardness
status_str n
ids_txt_mv (CKB)5400000000000611
(NjHacI)995400000000000611
(EXLCZ)995400000000000611
carrierType_str_mv cr
is_hierarchy_title Crystal indentation hardness /
author2_original_writing_str_mv noLinkedField
noLinkedField
noLinkedField
_version_ 1764994513508499456
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01749nam a2200325 i 4500</leader><controlfield tag="001">993561934204498</controlfield><controlfield tag="005">20230218195315.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr |||||||||||</controlfield><controlfield tag="008">230218s2018 sz a ob 000 0 eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3-03842-968-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CKB)5400000000000611</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(NjHacI)995400000000000611</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(EXLCZ)995400000000000611</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">NjHacI</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="c">NjHacl</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QE369.P49</subfield><subfield code="b">.C797 2018</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620.1126</subfield><subfield code="2">23</subfield></datafield><datafield tag="245" ind1="0" ind2="0"><subfield code="a">Crystal indentation hardness /</subfield><subfield code="c">edited by Ronald W. Armstrong, Stephen M. Walley, Wayne L. Elban.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Basel, Switzerland :</subfield><subfield code="b">MDPI,</subfield><subfield code="c">[2018]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">©2018</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (334 pages) :</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on publisher supplied metadata and other sources.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Determinations of the indentation hardness properties of crystals have expanded to cover the full characterizations of their important elastic, plastic and cracking behaviors, particularly as accomplished with the increased measuring capabilities of nanoindentation hardness testing. No crystal structure of any bonding type is either too soft or too hard to prevent measurement with a suitable probing indenter. The current Special Issue is devoted to surveying the topic with emphasis given in a collection of reports to: (1) the diversity of crystals being tested; (2) the variety of measuring techniques; and (3) the wealth of information being obtained.</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Hardness</subfield><subfield code="x">Testing.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Armstrong, Ronald W.,</subfield><subfield code="e">editor.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Walley, Stephen M.,</subfield><subfield code="e">editor.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Elban, Wayne L.,</subfield><subfield code="e">editor.</subfield></datafield><datafield tag="906" ind1=" " ind2=" "><subfield code="a">BOOK</subfield></datafield><datafield tag="ADM" ind1=" " ind2=" "><subfield code="b">2023-03-01 00:36:55 Europe/Vienna</subfield><subfield code="f">system</subfield><subfield code="c">marc21</subfield><subfield code="a">2020-10-31 22:37:04 Europe/Vienna</subfield><subfield code="g">false</subfield></datafield><datafield tag="AVE" ind1=" " ind2=" "><subfield code="P">DOAB Directory of Open Access Books</subfield><subfield code="x">https://eu02.alma.exlibrisgroup.com/view/uresolver/43ACC_OEAW/openurl?u.ignore_date_coverage=true&amp;portfolio_pid=5337594490004498&amp;Force_direct=true</subfield><subfield code="Z">5337594490004498</subfield><subfield code="8">5337594490004498</subfield></datafield></record></collection>