Mapping Good Work : : The Quality of Working Life Across the Occupational Structure / / Mark T. Williams, Ying Zhou, Min Zou.

Available Open Access under CC-BY-NC-ND licence In this enlightening study of modern working lives in Britain, leading experts on the sociology of work draw on detailed statistical analyses to assess job quality and job satisfaction. Drawing on decades of research data on hundreds of occupational gr...

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Bibliographic Details
Superior document:Bristol shorts research
VerfasserIn:
TeilnehmendeR:
Place / Publishing House:Bristol : : Bristol University Press,, 2020.
Year of Publication:2020
Edition:First edition.
Language:English
Series:Bristol shorts research.
Physical Description:1 online resource (ix, 152 pages). :; illustrations
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Description
Other title:Mapping Good Work
Front Matter --
Contents --
List of Figures and Tables --
List of Abbreviations --
Notes on the Authors --
Acknowledgments --
Introduction --
Mapping Good Work --
What Makes Work Good? --
The Good Work Hierarchy --
The Occupational Quality Structure --
The Changing Occupational Quality Structure --
Conclusions and Implications --
Notes --
References --
Index
Summary:Available Open Access under CC-BY-NC-ND licence In this enlightening study of modern working lives in Britain, leading experts on the sociology of work draw on detailed statistical analyses to assess job quality and job satisfaction. Drawing on decades of research data on hundreds of occupational groups, the authors challenge conventional notions of 'good work' and consider them afresh through the lens of workers themselves. With examples from many professions, the book examines why some occupations feel more rewarding than others, regardless of factors like pay and security. Exploring fresh policies to promote the agenda for fulfilling employment, it builds an important case for genuine and sustained satisfaction in working lives.
Bibliography:Includes bibliographical references and index.
ISBN:1529208319
Hierarchical level:Monograph
Statement of Responsibility: Mark T. Williams, Ying Zhou, Min Zou.