Reliability Analysis of Electrotechnical Devices

Reliability Analysis of Electrotechnical Devices

This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.

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Sonstige:
Tan, Cher Ming
Year of Publication:2022
Language:English
Physical Description:1 electronic resource (174 p.)
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id 993553555904498
ctrlnum (CKB)5600000000483020
(oapen)https://directory.doabooks.org/handle/20.500.12854/91210
(EXLCZ)995600000000483020
collection bib_alma
record_format marc
spelling Tan, Cher Ming edt
Reliability Analysis of Electrotechnical Devices
Basel MDPI - Multidisciplinary Digital Publishing Institute 2022
1 electronic resource (174 p.)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.
English
Technology: general issues bicssc
History of engineering & technology bicssc
3D-IC (three-dimensional integrated circuit)
electromagnetic interference
near field measurement
SAC305
BGA
low temperature
fracture failure
factorial design of experiment
genetic algorithm optimization
return loss
multiple-input multiple-output (MIMO)
single event effects
linear energy transfer
Monte Carlo simulation
radiation hardness
pressureless sintered micron silver joints
deep space environment
extreme thermal shocks
reconstruction
simulation
elastic mechanical properties
state of health
remaining useful life
electrochemistry based electrical model
semi-empirical capacity fading model
useful life distribution
quality and reliability assurance
single event effect
microdosimetry
lineal energy
deconvolution
gamma process
lifetime
measurement system analysis
reliability estimation
GaN
operational amplifier
proton therapy
prompt gamma imaging
3D X-ray
bias temperature-humidity reliability test
conductive anodic filament (CAF)
de-penalization
finite element analysis
3-0365-4653-7
3-0365-4654-5
Tan, Cher Ming oth
language English
format eBook
author2 Tan, Cher Ming
author_facet Tan, Cher Ming
author2_variant c m t cm cmt
author2_role Sonstige
title Reliability Analysis of Electrotechnical Devices
spellingShingle Reliability Analysis of Electrotechnical Devices
title_full Reliability Analysis of Electrotechnical Devices
title_fullStr Reliability Analysis of Electrotechnical Devices
title_full_unstemmed Reliability Analysis of Electrotechnical Devices
title_auth Reliability Analysis of Electrotechnical Devices
title_new Reliability Analysis of Electrotechnical Devices
title_sort reliability analysis of electrotechnical devices
publisher MDPI - Multidisciplinary Digital Publishing Institute
publishDate 2022
physical 1 electronic resource (174 p.)
isbn 3-0365-4653-7
3-0365-4654-5
illustrated Not Illustrated
work_keys_str_mv AT tancherming reliabilityanalysisofelectrotechnicaldevices
status_str n
ids_txt_mv (CKB)5600000000483020
(oapen)https://directory.doabooks.org/handle/20.500.12854/91210
(EXLCZ)995600000000483020
carrierType_str_mv cr
is_hierarchy_title Reliability Analysis of Electrotechnical Devices
author2_original_writing_str_mv noLinkedField
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