Flash Memory Devices

Flash memory devices have represented a breakthrough in storage since their inception in the mid-1980s, and innovation is still ongoing. The peculiarity of such technology is an inherent flexibility in terms of performance and integration density according to the architecture devised for integration...

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Year of Publication:2022
Language:English
Physical Description:1 electronic resource (144 p.)
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spelling Zambelli, Cristian edt
Flash Memory Devices
Basel MDPI - Multidisciplinary Digital Publishing Institute 2022
1 electronic resource (144 p.)
text txt rdacontent
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online resource cr rdacarrier
Flash memory devices have represented a breakthrough in storage since their inception in the mid-1980s, and innovation is still ongoing. The peculiarity of such technology is an inherent flexibility in terms of performance and integration density according to the architecture devised for integration. The NOR Flash technology is still the workhorse of many code storage applications in the embedded world, ranging from microcontrollers for automotive environment to IoT smart devices. Their usage is also forecasted to be fundamental in emerging AI edge scenario. On the contrary, when massive data storage is required, NAND Flash memories are necessary to have in a system. You can find NAND Flash in USB sticks, cards, but most of all in Solid-State Drives (SSDs). Since SSDs are extremely demanding in terms of storage capacity, they fueled a new wave of innovation, namely the 3D architecture. Today “3D” means that multiple layers of memory cells are manufactured within the same piece of silicon, easily reaching a terabit capacity. So far, Flash architectures have always been based on "floating gate," where the information is stored by injecting electrons in a piece of polysilicon surrounded by oxide. On the contrary, emerging concepts are based on "charge trap" cells. In summary, flash memory devices represent the largest landscape of storage devices, and we expect more advancements in the coming years. This will require a lot of innovation in process technology, materials, circuit design, flash management algorithms, Error Correction Code and, finally, system co-design for new applications such as AI and security enforcement.
English
Technology: general issues bicssc
retention characteristic
high-κ
nonvolatile charge-trapping memory
stack engineering
NOR flash memory
aluminum oxide
NAND flash memory
interference
Technology Computer Aided Design (TCAD) simulation
disturbance
program
non-volatile memory (NVM)
3D NAND Flash memories
random telegraph noise
Flash memory reliability
test platform
endurance
support vector machine
raw bit error
3D NAND Flash
RBER
reliability
flash signal processing
randomization scheme
solid-state drives
3D flash memory
performance cliff
tail latency
garbage collection
artificial neural network
error correction code
work function
effective work function
dipole
metal gate
high-k
SiO2
interfacial reaction
MHONOS
erase performance
3D NAND flash memory
temperature
read disturb
3-0365-3012-6
3-0365-3013-4
Micheloni, Rino edt
Zambelli, Cristian oth
Micheloni, Rino oth
language English
format eBook
author2 Micheloni, Rino
Zambelli, Cristian
Micheloni, Rino
author_facet Micheloni, Rino
Zambelli, Cristian
Micheloni, Rino
author2_variant c z cz
r m rm
author2_role HerausgeberIn
Sonstige
Sonstige
title Flash Memory Devices
spellingShingle Flash Memory Devices
title_full Flash Memory Devices
title_fullStr Flash Memory Devices
title_full_unstemmed Flash Memory Devices
title_auth Flash Memory Devices
title_new Flash Memory Devices
title_sort flash memory devices
publisher MDPI - Multidisciplinary Digital Publishing Institute
publishDate 2022
physical 1 electronic resource (144 p.)
isbn 3-0365-3012-6
3-0365-3013-4
illustrated Not Illustrated
work_keys_str_mv AT zambellicristian flashmemorydevices
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status_str n
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is_hierarchy_title Flash Memory Devices
author2_original_writing_str_mv noLinkedField
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