Advanced Process Monitoring for Industry 4.0

This book reports recent advances on Process Monitoring (PM) to cope with the many challenges raised by the new production systems, sensors and “extreme data” conditions that emerged with Industry 4.0. Concepts such as digital-twins and deep learning are brought to the PM arena, pushing forward the...

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Year of Publication:2021
Language:English
Physical Description:1 electronic resource (288 p.)
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id 993545664304498
ctrlnum (CKB)5400000000042916
(oapen)https://directory.doabooks.org/handle/20.500.12854/76899
(EXLCZ)995400000000042916
collection bib_alma
record_format marc
spelling Reis, Marco S. edt
Advanced Process Monitoring for Industry 4.0
Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute 2021
1 electronic resource (288 p.)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Open access Unrestricted online access star
This book reports recent advances on Process Monitoring (PM) to cope with the many challenges raised by the new production systems, sensors and “extreme data” conditions that emerged with Industry 4.0. Concepts such as digital-twins and deep learning are brought to the PM arena, pushing forward the capabilities of existing methodologies to handle more complex scenarios. The evolution of classical paradigms such as Latent Variable modeling, Six Sigma and FMEA are also covered. Applications span a wide range of domains such as microelectronics, semiconductors, chemicals, materials, agriculture, as well as the monitoring of rotating equipment, combustion systems and membrane separation processes.
English
Technology: general issues bicssc
spatial-temporal data
pasting process
process image
convolutional neural network
Industry 4.0
auto machine learning
failure mode effects analysis
risk priority number
rolling bearing
condition monitoring
classification
OPTICS
statistical process control
control chart pattern
disruptions
disruption management
fault diagnosis
construction industry
plaster production
neural networks
decision support systems
expert systems
failure mode and effects analysis (FMEA)
discriminant analysis
non-intrusive load monitoring
load identification
membrane
data reconciliation
real-time
online
monitoring
Six Sigma
multivariate data analysis
latent variables models
PCA
PLS
high-dimensional data
statistical process monitoring
artificial generation of variability
data augmentation
quality prediction
continuous casting
multiscale
time series classification
imbalanced data
combustion
optical sensors
spectroscopy measurements
signal detection
digital processing
principal component analysis
curve resolution
data mining
semiconductor manufacturing
quality control
yield improvement
fault detection
process control
multi-phase residual recursive model
multi-mode model
process monitoring
3-0365-2073-2
3-0365-2074-0
Gao, Furong edt
Reis, Marco S. oth
Gao, Furong oth
language English
format eBook
author2 Gao, Furong
Reis, Marco S.
Gao, Furong
author_facet Gao, Furong
Reis, Marco S.
Gao, Furong
author2_variant m s r ms msr
f g fg
author2_role HerausgeberIn
Sonstige
Sonstige
title Advanced Process Monitoring for Industry 4.0
spellingShingle Advanced Process Monitoring for Industry 4.0
title_full Advanced Process Monitoring for Industry 4.0
title_fullStr Advanced Process Monitoring for Industry 4.0
title_full_unstemmed Advanced Process Monitoring for Industry 4.0
title_auth Advanced Process Monitoring for Industry 4.0
title_new Advanced Process Monitoring for Industry 4.0
title_sort advanced process monitoring for industry 4.0
publisher MDPI - Multidisciplinary Digital Publishing Institute
publishDate 2021
physical 1 electronic resource (288 p.)
isbn 3-0365-2073-2
3-0365-2074-0
illustrated Not Illustrated
work_keys_str_mv AT reismarcos advancedprocessmonitoringforindustry40
AT gaofurong advancedprocessmonitoringforindustry40
status_str n
ids_txt_mv (CKB)5400000000042916
(oapen)https://directory.doabooks.org/handle/20.500.12854/76899
(EXLCZ)995400000000042916
carrierType_str_mv cr
is_hierarchy_title Advanced Process Monitoring for Industry 4.0
author2_original_writing_str_mv noLinkedField
noLinkedField
noLinkedField
_version_ 1787548474837827585
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03904nam-a2201057z--4500</leader><controlfield tag="001">993545664304498</controlfield><controlfield tag="005">20231214132842.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr|mn|---annan</controlfield><controlfield tag="008">202201s2021 xx |||||o ||| 0|eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CKB)5400000000042916</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(oapen)https://directory.doabooks.org/handle/20.500.12854/76899</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(EXLCZ)995400000000042916</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Reis, Marco S.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advanced Process Monitoring for Industry 4.0</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Basel, Switzerland</subfield><subfield code="b">MDPI - Multidisciplinary Digital Publishing Institute</subfield><subfield code="c">2021</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 electronic resource (288 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="506" ind1=" " ind2=" "><subfield code="a">Open access</subfield><subfield code="f">Unrestricted online access</subfield><subfield code="2">star</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">This book reports recent advances on Process Monitoring (PM) to cope with the many challenges raised by the new production systems, sensors and “extreme data” conditions that emerged with Industry 4.0. Concepts such as digital-twins and deep learning are brought to the PM arena, pushing forward the capabilities of existing methodologies to handle more complex scenarios. The evolution of classical paradigms such as Latent Variable modeling, Six Sigma and FMEA are also covered. Applications span a wide range of domains such as microelectronics, semiconductors, chemicals, materials, agriculture, as well as the monitoring of rotating equipment, combustion systems and membrane separation processes.</subfield></datafield><datafield tag="546" ind1=" " ind2=" "><subfield code="a">English</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Technology: general issues</subfield><subfield code="2">bicssc</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">spatial-temporal data</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">pasting process</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">process image</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">convolutional neural network</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Industry 4.0</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">auto machine learning</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">failure mode effects analysis</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">risk priority number</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">rolling bearing</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">condition monitoring</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">classification</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">OPTICS</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">statistical process control</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">control chart pattern</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">disruptions</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">disruption management</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">fault diagnosis</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">construction industry</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">plaster production</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">neural networks</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">decision support systems</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">expert systems</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">failure mode and effects analysis (FMEA)</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">discriminant analysis</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">non-intrusive load monitoring</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">load identification</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">membrane</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">data reconciliation</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">real-time</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">online</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">monitoring</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Six Sigma</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">multivariate data analysis</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">latent variables models</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">PCA</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">PLS</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">high-dimensional data</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">statistical process monitoring</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">artificial generation of variability</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">data augmentation</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">quality prediction</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">continuous casting</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">multiscale</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">time series classification</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">imbalanced data</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">combustion</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">optical sensors</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">spectroscopy measurements</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">signal detection</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">digital processing</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">principal component analysis</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">curve resolution</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">data mining</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">semiconductor manufacturing</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">quality control</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">yield improvement</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">fault detection</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">process control</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">multi-phase residual recursive model</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">multi-mode model</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">process monitoring</subfield></datafield><datafield tag="776" ind1=" " ind2=" "><subfield code="z">3-0365-2073-2</subfield></datafield><datafield tag="776" ind1=" " ind2=" "><subfield code="z">3-0365-2074-0</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Gao, Furong</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Reis, Marco S.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Gao, Furong</subfield><subfield code="4">oth</subfield></datafield><datafield tag="906" ind1=" " ind2=" "><subfield code="a">BOOK</subfield></datafield><datafield tag="ADM" ind1=" " ind2=" "><subfield code="b">2023-12-15 05:33:56 Europe/Vienna</subfield><subfield code="f">system</subfield><subfield code="c">marc21</subfield><subfield code="a">2022-04-04 09:22:53 Europe/Vienna</subfield><subfield code="g">false</subfield></datafield><datafield tag="AVE" ind1=" " ind2=" "><subfield code="i">DOAB Directory of Open Access Books</subfield><subfield code="P">DOAB Directory of Open Access Books</subfield><subfield code="x">https://eu02.alma.exlibrisgroup.com/view/uresolver/43ACC_OEAW/openurl?u.ignore_date_coverage=true&amp;portfolio_pid=5337991880004498&amp;Force_direct=true</subfield><subfield code="Z">5337991880004498</subfield><subfield code="b">Available</subfield><subfield code="8">5337991880004498</subfield></datafield></record></collection>