Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV
In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...
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Superior document: | Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik |
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Year of Publication: | 2014 |
Language: | German |
Series: | Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
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Physical Description: | 1 electronic resource (IX, 126 p. p.) |
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