New trends and developments in metrology / / edited by Luigi Cocco.
Investigating the incessant technology growth and the even higher complexity of engineering systems, one of the crucial requirements to confidently steer both scientific and industrial challenges is to identify an appropriate measurement approach. A general process can be considered effective and un...
Saved in:
: | |
---|---|
TeilnehmendeR: | |
Place / Publishing House: | Rijeka, Croatia : : IntechOpen,, [2016] ©2016 |
Year of Publication: | 2016 |
Language: | English |
Physical Description: | 1 online resource (292 pages) :; illustrations |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
id |
993545649304498 |
---|---|
ctrlnum |
(CKB)4970000000099088 (NjHacI)994970000000099088 (oapen)https://directory.doabooks.org/handle/20.500.12854/54623 (EXLCZ)994970000000099088 |
collection |
bib_alma |
record_format |
marc |
spelling |
Luigi Cocco auth New trends and developments in metrology / edited by Luigi Cocco. IntechOpen 2016 Rijeka, Croatia : IntechOpen, [2016] ©2016 1 online resource (292 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier Description based on: online resource; title from PDF information screen (InTech, viewed October 6, 2022). Includes bibliographical references. Investigating the incessant technology growth and the even higher complexity of engineering systems, one of the crucial requirements to confidently steer both scientific and industrial challenges is to identify an appropriate measurement approach. A general process can be considered effective and under control if the following elements are consciously and cyclically managed: numeric target, adequate tools, output analysis, and corrective actions. The role of metrology is to rigorously harmonize this virtuous circle, providing guidance in terms of instruments, standards, and techniques to improve the robustness and the accuracy of the results. This book is designed to offer an interdisciplinary experience into the science of measurement, not only covering high-level measurement strategies but also supplying analytical details and experimental setups. English Metrology. Engineering Physical Sciences Engineering and Technology Electrical and Electronic Engineering Metrology 953-51-2477-3 Cocco, Luigi, editor. |
language |
English |
format |
eBook |
author |
Luigi Cocco |
spellingShingle |
Luigi Cocco New trends and developments in metrology / |
author_facet |
Luigi Cocco Cocco, Luigi, |
author_variant |
l c lc |
author2 |
Cocco, Luigi, |
author2_variant |
l c lc |
author2_role |
TeilnehmendeR |
author_sort |
Luigi Cocco |
title |
New trends and developments in metrology / |
title_full |
New trends and developments in metrology / edited by Luigi Cocco. |
title_fullStr |
New trends and developments in metrology / edited by Luigi Cocco. |
title_full_unstemmed |
New trends and developments in metrology / edited by Luigi Cocco. |
title_auth |
New trends and developments in metrology / |
title_new |
New trends and developments in metrology / |
title_sort |
new trends and developments in metrology / |
publisher |
IntechOpen IntechOpen, |
publishDate |
2016 |
physical |
1 online resource (292 pages) : illustrations |
isbn |
953-51-4195-3 953-51-2478-1 953-51-2477-3 |
callnumber-first |
Q - Science |
callnumber-subject |
QC - Physics |
callnumber-label |
QC88 |
callnumber-sort |
QC 288 N49 42016 |
illustrated |
Illustrated |
dewey-hundreds |
300 - Social sciences |
dewey-tens |
380 - Commerce, communications & transportation |
dewey-ones |
389 - Metrology & standardization |
dewey-full |
389.1 |
dewey-sort |
3389.1 |
dewey-raw |
389.1 |
dewey-search |
389.1 |
work_keys_str_mv |
AT luigicocco newtrendsanddevelopmentsinmetrology AT coccoluigi newtrendsanddevelopmentsinmetrology |
status_str |
n |
ids_txt_mv |
(CKB)4970000000099088 (NjHacI)994970000000099088 (oapen)https://directory.doabooks.org/handle/20.500.12854/54623 (EXLCZ)994970000000099088 |
carrierType_str_mv |
cr |
is_hierarchy_title |
New trends and developments in metrology / |
author2_original_writing_str_mv |
noLinkedField |
_version_ |
1796649061867061248 |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01033nam a2200313 i 4500</leader><controlfield tag="001">993545649304498</controlfield><controlfield tag="005">20221007221051.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr |||||||||||</controlfield><controlfield tag="008">221007s2016 ci a ob 000 0 eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">953-51-4195-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">953-51-2478-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CKB)4970000000099088</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(NjHacI)994970000000099088</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(oapen)https://directory.doabooks.org/handle/20.500.12854/54623</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(EXLCZ)994970000000099088</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">NjHacI</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="c">NjHacl</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QC88</subfield><subfield code="b">.N49 2016</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">389.1</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Luigi Cocco</subfield><subfield code="4">auth</subfield></datafield><datafield tag="245" ind1="0" ind2="0"><subfield code="a">New trends and developments in metrology /</subfield><subfield code="c">edited by Luigi Cocco.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="b">IntechOpen</subfield><subfield code="c">2016</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Rijeka, Croatia :</subfield><subfield code="b">IntechOpen,</subfield><subfield code="c">[2016]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">©2016</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (292 pages) :</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on: online resource; title from PDF information screen (InTech, viewed October 6, 2022).</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Investigating the incessant technology growth and the even higher complexity of engineering systems, one of the crucial requirements to confidently steer both scientific and industrial challenges is to identify an appropriate measurement approach. A general process can be considered effective and under control if the following elements are consciously and cyclically managed: numeric target, adequate tools, output analysis, and corrective actions. The role of metrology is to rigorously harmonize this virtuous circle, providing guidance in terms of instruments, standards, and techniques to improve the robustness and the accuracy of the results. This book is designed to offer an interdisciplinary experience into the science of measurement, not only covering high-level measurement strategies but also supplying analytical details and experimental setups.</subfield></datafield><datafield tag="546" ind1=" " ind2=" "><subfield code="a">English</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Metrology.</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Engineering</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Physical Sciences</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Engineering and Technology</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Electrical and Electronic Engineering</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">Metrology</subfield></datafield><datafield tag="776" ind1=" " ind2=" "><subfield code="z">953-51-2477-3</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Cocco, Luigi,</subfield><subfield code="e">editor.</subfield></datafield><datafield tag="906" ind1=" " ind2=" "><subfield code="a">BOOK</subfield></datafield><datafield tag="ADM" ind1=" " ind2=" "><subfield code="b">2023-02-22 20:03:05 Europe/Vienna</subfield><subfield code="f">system</subfield><subfield code="c">marc21</subfield><subfield code="a">2019-04-13 22:04:18 Europe/Vienna</subfield><subfield code="g">false</subfield></datafield><datafield tag="AVE" ind1=" " ind2=" "><subfield code="i">DOAB Directory of Open Access Books</subfield><subfield code="P">DOAB Directory of Open Access Books</subfield><subfield code="x">https://eu02.alma.exlibrisgroup.com/view/uresolver/43ACC_OEAW/openurl?u.ignore_date_coverage=true&portfolio_pid=5351637470004498&Force_direct=true</subfield><subfield code="Z">5351637470004498</subfield><subfield code="b">Available</subfield><subfield code="8">5351637470004498</subfield></datafield></record></collection> |