Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodo...
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Superior document: | Steinbuch Series on Advances in Information Technology / Karlsruher Institut für Technologie, Institut für Technik der Informationsverarbeitung |
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Year of Publication: | 2013 |
Language: | English |
Series: | Steinbuch Series on Advances in Information Technology / Karlsruher Institut für Technologie, Institut für Technik der Informationsverarbeitung
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Physical Description: | 1 electronic resource (IX, 146 p. p.) |
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520 | |a Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations. | ||
546 | |a English | ||
653 | |a Space | ||
653 | |a High reliability | ||
653 | |a FPGA | ||
653 | |a Redundancy | ||
653 | |a Single Event Upset | ||
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