Challenges and New Trends in Power Electronic Devices Reliability

Challenges and New Trends in Power Electronic Devices Reliability

Show other versions (1)

The rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, eval...

Full description

Saved in:
Bibliographic Details
HerausgeberIn:
Chiodo, Elio
Di Noia, Luigi Pio
Sonstige:
Falco, Pasquale De
Chiodo, Elio
Di Noia, Luigi Pio
Year of Publication:2021
Language:English
Physical Description:1 electronic resource (207 p.)
Tags: Add Tag
No Tags, Be the first to tag this record!
id 993545123204498
ctrlnum (CKB)5400000000042729
(oapen)https://directory.doabooks.org/handle/20.500.12854/76306
(EXLCZ)995400000000042729
collection bib_alma
record_format marc
spelling Falco, Pasquale De edt
Challenges and New Trends in Power Electronic Devices Reliability
Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute 2021
1 electronic resource (207 p.)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
The rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, evaluation of the reliability and availability of these devices becomes fundamental both from technical and economicalpoints of view. The rapid evolution of technologies and the high reliability level offered by these components have shown that estimating reliability through the traditional approaches is difficult, as historical failure data and/or past observed scenarios demonstrate. With the aim topropose new approaches for the evaluation of reliability, in this book, eleven innovative contributions are collected, all focusedon the reliability assessment of power electronic devices and related components.
English
Technology: general issues bicssc
Energy industries & utilities bicssc
photovoltaic system
battery
DC-coupled configuration
AC-coupled configuration
mission profile
reliability
LED
thermal cycling test
accelerated test
solder joint
cracks
current harmonics
voltage harmonics
power electronic converters
cables
capacitors
PPS
high-power thyristors
reverse recovery currents
electromagnetic launching field
segmented LSTM
microgrid inverter
IGBT reliability
online evaluation
fusion algorithm
multi-chip IGBT module
bond wire
module transconductance
temperature calibration
failure monitoring
sensor lamp
low-light mode
high-light mode
AC motor drive
junction temperature
lifetime prediction
power MOSFET
loss modeling
SiC MOSFET
AlGaN/GaN HEMT
cascode structure
single event effects
technology computer-aided design simulation
heavy-ion irradiation experiment
photovoltaic systems
DC/AC converter
maintenance
power system faults
availability
condition monitoring
power device
power electronics
n/a
3-0365-1177-6
3-0365-1176-8
Chiodo, Elio edt
Di Noia, Luigi Pio edt
Falco, Pasquale De oth
Chiodo, Elio oth
Di Noia, Luigi Pio oth
language English
format eBook
author2 Chiodo, Elio
Di Noia, Luigi Pio
Falco, Pasquale De
Chiodo, Elio
Di Noia, Luigi Pio
author_facet Chiodo, Elio
Di Noia, Luigi Pio
Falco, Pasquale De
Chiodo, Elio
Di Noia, Luigi Pio
author2_variant p d f pd pdf
e c ec
n l p d nlp nlpd
author2_role HerausgeberIn
HerausgeberIn
Sonstige
Sonstige
Sonstige
title Challenges and New Trends in Power Electronic Devices Reliability
spellingShingle Challenges and New Trends in Power Electronic Devices Reliability
title_full Challenges and New Trends in Power Electronic Devices Reliability
title_fullStr Challenges and New Trends in Power Electronic Devices Reliability
title_full_unstemmed Challenges and New Trends in Power Electronic Devices Reliability
title_auth Challenges and New Trends in Power Electronic Devices Reliability
title_new Challenges and New Trends in Power Electronic Devices Reliability
title_sort challenges and new trends in power electronic devices reliability
publisher MDPI - Multidisciplinary Digital Publishing Institute
publishDate 2021
physical 1 electronic resource (207 p.)
isbn 3-0365-1177-6
3-0365-1176-8
illustrated Not Illustrated
work_keys_str_mv AT falcopasqualede challengesandnewtrendsinpowerelectronicdevicesreliability
AT chiodoelio challengesandnewtrendsinpowerelectronicdevicesreliability
AT dinoialuigipio challengesandnewtrendsinpowerelectronicdevicesreliability
status_str n
ids_txt_mv (CKB)5400000000042729
(oapen)https://directory.doabooks.org/handle/20.500.12854/76306
(EXLCZ)995400000000042729
carrierType_str_mv cr
is_hierarchy_title Challenges and New Trends in Power Electronic Devices Reliability
author2_original_writing_str_mv noLinkedField
noLinkedField
noLinkedField
noLinkedField
noLinkedField
_version_ 1759318917855051776
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03815nam-a2200985z--4500</leader><controlfield tag="001">993545123204498</controlfield><controlfield tag="005">20230221122927.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr|mn|---annan</controlfield><controlfield tag="008">202201s2021 xx |||||o ||| eneng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CKB)5400000000042729</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(oapen)https://directory.doabooks.org/handle/20.500.12854/76306</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(EXLCZ)995400000000042729</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Falco, Pasquale De</subfield><subfield code="4">edt</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Challenges and New Trends in Power Electronic Devices Reliability</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Basel, Switzerland</subfield><subfield code="b">MDPI - Multidisciplinary Digital Publishing Institute</subfield><subfield code="c">2021</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 electronic resource (207 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">The rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, evaluation of the reliability and availability of these devices becomes fundamental both from technical and economicalpoints of view. The rapid evolution of technologies and the high reliability level offered by these components have shown that estimating reliability through the traditional approaches is difficult, as historical failure data and/or past observed scenarios demonstrate. With the aim topropose new approaches for the evaluation of reliability, in this book, eleven innovative contributions are collected, all focusedon the reliability assessment of power electronic devices and related components.</subfield></datafield><datafield tag="546" ind1=" " ind2=" "><subfield code="a">English</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Technology: general issues</subfield><subfield code="2">bicssc</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Energy industries &amp; utilities</subfield><subfield code="2">bicssc</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">photovoltaic system</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">battery</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">DC-coupled configuration</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">AC-coupled configuration</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">mission profile</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">reliability</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">LED</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">thermal cycling test</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">accelerated test</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">solder joint</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">cracks</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">current harmonics</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">voltage harmonics</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">power electronic converters</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">cables</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">capacitors</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">PPS</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">high-power thyristors</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">reverse recovery currents</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">electromagnetic launching field</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">segmented LSTM</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">microgrid inverter</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">IGBT reliability</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">online evaluation</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">fusion algorithm</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">multi-chip IGBT module</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">bond wire</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">module transconductance</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">temperature calibration</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">failure monitoring</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">sensor lamp</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">low-light mode</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">high-light mode</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">AC motor drive</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">junction temperature</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">lifetime prediction</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">power MOSFET</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">loss modeling</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">SiC MOSFET</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">AlGaN/GaN HEMT</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">cascode structure</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">single event effects</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">technology computer-aided design simulation</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">heavy-ion irradiation experiment</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">photovoltaic systems</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">DC/AC converter</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">maintenance</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">power system faults</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">availability</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">condition monitoring</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">power device</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">power electronics</subfield></datafield><datafield tag="653" ind1=" " ind2=" "><subfield code="a">n/a</subfield></datafield><datafield tag="776" ind1=" " ind2=" "><subfield code="z">3-0365-1177-6</subfield></datafield><datafield tag="776" ind1=" " ind2=" "><subfield code="z">3-0365-1176-8</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chiodo, Elio</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Di Noia, Luigi Pio</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Falco, Pasquale De</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chiodo, Elio</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Di Noia, Luigi Pio</subfield><subfield code="4">oth</subfield></datafield><datafield tag="906" ind1=" " ind2=" "><subfield code="a">BOOK</subfield></datafield><datafield tag="ADM" ind1=" " ind2=" "><subfield code="b">2023-03-03 04:00:57 Europe/Vienna</subfield><subfield code="f">system</subfield><subfield code="c">marc21</subfield><subfield code="a">2022-04-04 09:22:53 Europe/Vienna</subfield><subfield code="g">false</subfield></datafield><datafield tag="AVE" ind1=" " ind2=" "><subfield code="P">DOAB Directory of Open Access Books</subfield><subfield code="x">https://eu02.alma.exlibrisgroup.com/view/uresolver/43ACC_OEAW/openurl?u.ignore_date_coverage=true&amp;portfolio_pid=5337909530004498&amp;Force_direct=true</subfield><subfield code="Z">5337909530004498</subfield><subfield code="8">5337909530004498</subfield></datafield></record></collection>

Similar Items