Rietveld Refinement in the Characterization of Crystalline Materials

Rietveld Refinement in the Characterization of Crystalline Materials

This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.

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Igor Djerdj (Ed.)
Year of Publication:2019
Language:English
Physical Description:1 electronic resource (88 p.)
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spelling Igor Djerdj (Ed.) auth
Rietveld Refinement in the Characterization of Crystalline Materials
MDPI - Multidisciplinary Digital Publishing Institute 2019
1 electronic resource (88 p.)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.
English
Rietveld method
Structural characterization
Microstructural analysis
Crystalline materials
Structural materials
X-ray and neutron diffraction
Functional materials
3-03897-527-3
language English
format eBook
author Igor Djerdj (Ed.)
spellingShingle Igor Djerdj (Ed.)
Rietveld Refinement in the Characterization of Crystalline Materials
author_facet Igor Djerdj (Ed.)
author_variant i d e ide
author_sort Igor Djerdj (Ed.)
title Rietveld Refinement in the Characterization of Crystalline Materials
title_full Rietveld Refinement in the Characterization of Crystalline Materials
title_fullStr Rietveld Refinement in the Characterization of Crystalline Materials
title_full_unstemmed Rietveld Refinement in the Characterization of Crystalline Materials
title_auth Rietveld Refinement in the Characterization of Crystalline Materials
title_new Rietveld Refinement in the Characterization of Crystalline Materials
title_sort rietveld refinement in the characterization of crystalline materials
publisher MDPI - Multidisciplinary Digital Publishing Institute
publishDate 2019
physical 1 electronic resource (88 p.)
isbn 3-03897-528-1
3-03897-527-3
illustrated Not Illustrated
work_keys_str_mv AT igordjerdjed rietveldrefinementinthecharacterizationofcrystallinematerials
status_str n
ids_txt_mv (CKB)4920000000094938
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is_hierarchy_title Rietveld Refinement in the Characterization of Crystalline Materials
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