RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simula...
Saved in:
| Superior document: | Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik |
|---|---|
| : | |
| Year of Publication: | 2018 |
| Language: | English |
| Series: | Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik
|
| Physical Description: | 1 electronic resource (XII, 180 p. p.) |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Summary: | Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions. |
|---|---|
| ISBN: | 1000084392 |
| Hierarchical level: | Monograph |