Surface characterization of ordered and disordered SiO2 [SiO tief 2] / Wolfram Steurer
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| VerfasserIn: | |
|---|---|
| Place / Publishing House: | 2008 |
| Year of Publication: | 2008 |
| Language: | English |
| Subjects: | |
| Classification: | 33.05 - Experimentalphysik 33.68 - Oberflächen. Dünne Schichten. Grenzflächen |
| Physical Description: | XI, 147 S.; graph. Darst. |
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OeAW BAS:IS (Library, Archiv, Collections)
| Location: | BASIS-Monographies |
| Call Numbers: | 37381-C.Stip. |
| Call Number | 2nd Call Number | Description | Location | Remarks | Status | Availability | Order |
|---|---|---|---|---|---|---|---|
| 37381-C.Stip. | BASIS-Monographies | Loan | Available | Place a Hold |