An approach to the metrologically sound traceable assessment of the chemical purity of organic refernece materials / David L. Duewer ...
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| Superior document: | NIST special publication 1012 |
|---|---|
| MitwirkendeR: | |
| Place / Publishing House: | Washington, DC : U.S. Government Printing Office, 2004 |
| Year of Publication: | 2004 |
| Language: | English |
| Series: | NIST special publication
1012 |
| Physical Description: | 47 S.; 28 cm |
| Notes: | Literaturverz. S. 40 - 47 |
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OeAW BAS:IS (Library, Archiv, Collections)
| Location: | BASIS-Journals TSP |
| Call Numbers: | 100317.1012 |
| Call Number | 2nd Call Number | Description | Location | Remarks | Status | Availability | Order |
|---|---|---|---|---|---|---|---|
| 100317.1012 | BASIS-Journals TSP | Loan | Available | Place a Hold |