Particle size characterization

Particle size characterization / Ajit Jillavenkatesa ; Stanley J. Dapkunas ; Lin-Hsien H. Lum

Saved in:
Bibliographic Details
Superior document:NIST special publication 960-1 : NIST recommended practice guide
VerfasserIn:
Jillavenkatesa, Ajit
Dapkunas, Stanley J.
Lum, Lien-Sien H.
Place / Publishing House:Washington, DC : NIST, 2001
Year of Publication:2001
Language:English
Series:NIST special publication 960-1 : NIST recommended practice guide
Physical Description:V, 165 S.; Ill., graph. Darst.; 22 cm
Notes:Literaturangaben
Tags: Add Tag
No Tags, Be the first to tag this record!
id 990000370460504498
ctrlnum AC03237067
(AT-OBV)AC03237067
(Aleph)003231444ACC01
(DE-599)OBVAC03237067
(EXLNZ-43ACC_NETWORK)990032314440203331
collection bib_alma
institution YWOAW
building MAG2-1
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00894nam#a2200289zcb4500</leader><controlfield tag="001">990000370460504498</controlfield><controlfield tag="005">20230429192126.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">010810|2001####|||###########|||#|#eng#c</controlfield><controlfield tag="009">AC03237067</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(AT-OBV)AC03237067</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">AC03237067</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Aleph)003231444ACC01</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)OBVAC03237067</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(EXLNZ-43ACC_NETWORK)990032314440203331</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">OAW</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="c">XD-US</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Jillavenkatesa, Ajit</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Particle size characterization</subfield><subfield code="c">Ajit Jillavenkatesa ; Stanley J. Dapkunas ; Lin-Hsien H. Lum</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Washington, DC</subfield><subfield code="b">NIST</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">V, 165 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield><subfield code="c">22 cm</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">NIST special publication</subfield><subfield code="v">960-1 : NIST recommended practice guide</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dapkunas, Stanley J.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Lum, Lien-Sien H.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="w">(AT-OBV)AC00350863</subfield><subfield code="v">960-1</subfield></datafield><datafield tag="970" ind1="1" ind2=" "><subfield code="c">33</subfield></datafield><datafield tag="ADM" ind1=" " ind2=" "><subfield code="b">2023-04-29 19:21:26 Europe/Vienna</subfield><subfield code="d">20</subfield><subfield code="f">System</subfield><subfield code="c">marc21</subfield><subfield code="a">2018-12-24 09:37:35 Europe/Vienna</subfield><subfield code="g">false</subfield></datafield><datafield tag="HOL" ind1="8" ind2=" "><subfield code="b">YWOAW</subfield><subfield code="h"> 100317.960-1 </subfield><subfield code="c">MAG2-1</subfield><subfield code="8">2218440020004498</subfield></datafield><datafield tag="852" ind1="8" ind2=" "><subfield code="b">YWOAW</subfield><subfield code="c">MAG2-1</subfield><subfield code="h"> 100317.960-1 </subfield><subfield code="8">2218440020004498</subfield></datafield><datafield tag="ITM" ind1=" " ind2=" "><subfield code="9">2218440020004498</subfield><subfield code="e">1</subfield><subfield code="m">BOOK</subfield><subfield code="b">+YW1228705</subfield><subfield code="i">100317.960-1</subfield><subfield code="2">MAG2-1</subfield><subfield code="o">2001-08-10 11:33:45</subfield><subfield code="8">2318440010004498</subfield><subfield code="f">02</subfield><subfield code="p">2001-08-10 02:00:00 Europe/Vienna</subfield><subfield code="h">100317.960-1</subfield><subfield code="1">YWOAW</subfield><subfield code="q">2022-06-20 23:39:02 Europe/Vienna</subfield></datafield></record></collection>
record_format marc
spelling Jillavenkatesa, Ajit aut
Particle size characterization Ajit Jillavenkatesa ; Stanley J. Dapkunas ; Lin-Hsien H. Lum
Washington, DC NIST 2001
V, 165 S. Ill., graph. Darst. 22 cm
NIST special publication 960-1 : NIST recommended practice guide
Literaturangaben
Dapkunas, Stanley J. aut
Lum, Lien-Sien H. aut
(AT-OBV)AC00350863 960-1
YWOAW MAG2-1 100317.960-1 2218440020004498
language English
format Book
author Jillavenkatesa, Ajit
Dapkunas, Stanley J.
Lum, Lien-Sien H.
spellingShingle Jillavenkatesa, Ajit
Dapkunas, Stanley J.
Lum, Lien-Sien H.
Particle size characterization
NIST special publication
author_facet Jillavenkatesa, Ajit
Dapkunas, Stanley J.
Lum, Lien-Sien H.
Dapkunas, Stanley J.
Lum, Lien-Sien H.
author_variant a j aj
s j d sj sjd
l s h l lsh lshl
author_role VerfasserIn
VerfasserIn
VerfasserIn
author2 Dapkunas, Stanley J.
Lum, Lien-Sien H.
author2_role VerfasserIn
VerfasserIn
author_sort Jillavenkatesa, Ajit
title Particle size characterization
title_full Particle size characterization Ajit Jillavenkatesa ; Stanley J. Dapkunas ; Lin-Hsien H. Lum
title_fullStr Particle size characterization Ajit Jillavenkatesa ; Stanley J. Dapkunas ; Lin-Hsien H. Lum
title_full_unstemmed Particle size characterization Ajit Jillavenkatesa ; Stanley J. Dapkunas ; Lin-Hsien H. Lum
title_auth Particle size characterization
title_new Particle size characterization
title_sort particle size characterization
series NIST special publication
series2 NIST special publication
publisher NIST
publishDate 2001
physical V, 165 S. Ill., graph. Darst. 22 cm
callnumber-raw 100317.960-1
callnumber-search 100317.960-1
illustrated Illustrated
work_keys_str_mv AT jillavenkatesaajit particlesizecharacterization
AT dapkunasstanleyj particlesizecharacterization
AT lumliensienh particlesizecharacterization
status_str n
ids_txt_mv (AT-OBV)AC03237067
AC03237067
(Aleph)003231444ACC01
(DE-599)OBVAC03237067
(EXLNZ-43ACC_NETWORK)990032314440203331
hol852bOwn_txt_mv YWOAW
hol852hSignatur_txt_mv 100317.960-1
hol852cSonderstandort_txt_mv MAG2-1
itmData_txt_mv 2001-08-10 02:00:00 Europe/Vienna
barcode_str_mv +YW1228705
callnumbers_txt_mv 100317.960-1
inventoryNumbers_str_mv 100317.960-1
materialTypes_str_mv BOOK
permanentLibraries_str_mv YWOAW
permanentLocations_str_mv MAG2-1
inventoryDates_str_mv 2001-08-10 11:33:45
createdDates_str_mv 2001-08-10 02:00:00 Europe/Vienna
holdingIds_str_mv 2218440020004498
hierarchy_parent_id AC00350863
hierarchy_parent_title NIST special publication 960-1 : NIST recommended practice guide
hierarchy_sequence 960-1
is_hierarchy_id AC03237067
is_hierarchy_title Particle size characterization
container_title NIST special publication 960-1 : NIST recommended practice guide
container_reference AC00350863
author2_original_writing_str_mv noLinkedField
noLinkedField
_version_ 1787548193129496576

Similar Items