Crystal Research and Technology : : Journal of Experimental and Industrial Crystallography / Zeitschrift für experimentelle und technische Kristallographie. / Volume 23, Number 1, : January / / hrsg. von H. Neels.

• Superior document: Title is part of eBook package: De Gruyter DGBA Physical Sciences <1990
• MitwirkendeR: Auleytner, J,; Bak-Misiuk, J,; Berger, H,; Bhar, G . C.,; Braun, U.,; Buhrig, E,; Butter, E,; Demus, D,; Diele, S,; Feltz, A.,; Fenster, J,; Fichtner, K.,; Finger, G.,; Fischer, K .,; Furmanik, Z.,; Geidel, B,; Ghosh, D . K,; Goliö, L,; Gottschalch, V.,; Görls, H.,; Hein, K,; Hejtminek, J,; Heydenbeich, J,; Hobler, H.-J.,; Jurek, K,; Jurkschat, K,; Kamarad, J,; Kbesse, H.,; Klimakow, A.,; Koknatowski, J .,; Kurth, E.,; Kühn, G.,; Leban, I .,; Mihailov, M.G.,; Minchev, G. M,; Morawiec, J .,; Mühlberg, M.,; Neumann, H.,; Nowak, E,; Omar, M. S.,; Paufler, P,; Pfaff, G.,; Pollert, E,; Pramatarova, L . D,; Rabenstein, P,; Reif, A.,; Richter, R,; Rosenthal, U,; Samanta, L.K,; Savova, E . B,; Schenk, M.,; Schmitz, W,; Schmitz, W.,; Schreiter, P,; Schulz, B,; Schulz, W,; Schumann, B .,; Sieleb, J,; Sinn, E,; Stettin, H.,; Tempel, A.,; Triska, A,; Umpfenbach, U,; Wagner, G.,; Walter, G,; Weissflog, W,; Werner, U.,; Wienecke, M.,; Zahn, A.,; Zemanova, D.,
• HerausgeberIn: Neels, H.,
• Place / Publishing House: Berlin ;, Boston : : De Gruyter, , [2022]; ©1988
• Year of Publication: 2022
• Edition: Reprint 2021
• Language: German
• Series: Crystal Research and Technology ; Volume 23, Number 1
• Physical Description: 1 online resource (174 p.)

Table of Contents

• Frontmatter
• Review
• Epitaxy of AIBIIICVI2 Semiconductors
• Original Papers
• Solid-State Reactivity and Mechanisms in Oxide Systems (IV)
• Crystal and Molecular Structure of (2-3-n-2-Butyne-l,4-diol)-bis-(triphenylphosphan)- nickel(O) Ni{[(C6H5)3P]2 (C4H6O2)}
• Crystal and Molecular Structure of N-(Diethylaminothiocarbonyl)-N'-phenyl-benzamidine
• Slip Band Formation during Bending of GaP Wafers
• OD Approach to the Polytypism in CdP2
• Revealing of Lattice Defects on (111) Faces of Gallium Phosphide and Indium Phosphide by Chemical Etching
• Lattice Constants and Site Preference in the System Ni2SiO4-Co2SiO4
• Nonstoichiometry and Point Defects in PbTe
• Simulation of the Carrier Diffusion Process for the Interpretation of EBIC Profiles
• Microhardness Scaling and Bulk Modulus-Microhardness Relationship in A"BIVCV2 Chalcopyrite Compounds
• Heat Capacity of Ag8Ge10P12 from 180 to 550 K
• Crystallographic Investigations of Glaucochroite in an Fe-Mn Slag
• X-ray Determination of Solid Solution Composition in the Melilite System Äkermanite (AK) — Gehlenite (Ge) - Soda Melilite (Sm)
• Chemical Etching and Polishing of InP
• Calculation of One-Dimensional Temperatures Profiles in a Crystal Growth Furnace with Special Respect to Germanium
• Liquid Crystalline Swallow-Tailed Compounds (II)
• Short Notes
• The Correlation between the Crystallization Field of Y3Fe5O12 and the Oxygen Ion Concentration of High-temperature Solvents
• Effect of the Pressing on the Properties of the Superconducting YBa2Cu3O7-x Phase
• Preparation of GaAs Substrates for MBE
• Optical Properties of Some Quaternary Copper Chalcopyrites
• On the Possibility of Application of X-ray Diffraction Edge Contrast for the Quantitative Determination of High-energy Heavy Ion Range in Silicon
• Growth of NaX Zeolites in the Presence of Triethanolamine (TEA)
• Contents