Rietveld Refinement : : Practical Powder Diffraction Pattern Analysis using TOPAS / / Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans.
Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Althou...
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Dinnebier, Robert E. , author. aut http://id.loc.gov/vocabulary/relators/aut Rietveld Refinement : Practical Powder Diffraction Pattern Analysis using TOPAS / Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans. Berlin ; Boston : De Gruyter, [2018] ©2019 1 online resource (XVI, 331 p.) text txt rdacontent computer c rdamedia online resource cr rdacarrier text file PDF rda De Gruyter STEM Frontmatter -- Preface -- Contents -- 1. The powder diffraction method -- 2. The Rietveld method -- 3. Structure independent fitting -- 4. Peak shapes: Instrument o microstructure -- 5. Quantitative phase analysis -- 6. Restraints, constraints and rigid bodies -- 7. Solving crystal structures using the Rietveld method -- 8. Symmetry mode refinements -- 9. Magnetic refinements -- 10. Stacking disorder -- 11. Total scattering methods -- 12. Multiple data sets -- 13. Appendix: Mathematical basics -- Index restricted access http://purl.org/coar/access_right/c_16ec online access with authorization star Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard. Mode of access: Internet via World Wide Web. In English. Description based on online resource; title from PDF title page (publisher's Web site, viewed 30. Aug 2021) Crystallography. Rietveld method. X-rays Diffraction. SCIENCE / Physics / Condensed Matter. bisacsh Evans, John S.O., author. aut http://id.loc.gov/vocabulary/relators/aut Leineweber, Andreas , author. aut http://id.loc.gov/vocabulary/relators/aut Title is part of eBook package: De Gruyter DG Plus eBook-Package 2019 9783110719567 Title is part of eBook package: De Gruyter EBOOK PACKAGE COMPLETE DG 2019 English 9783110616859 Title is part of eBook package: De Gruyter EBOOK PACKAGE COMPLETE 2018 English 9783110604252 Title is part of eBook package: De Gruyter EBOOK PACKAGE COMPLETE 2018 9783110603255 ZDB-23-DGG Title is part of eBook package: De Gruyter EBOOK PACKAGE Physics, Chem., Mat.Sc, Geosc 2018 English 9783110604221 Title is part of eBook package: De Gruyter EBOOK PACKAGE Physics, Chemistry, Materials Sc, Geosc 2018 9783110603224 ZDB-23-DPC EPUB 9783110461404 print 9783110456219 https://doi.org/10.1515/9783110461381 https://www.degruyter.com/isbn/9783110461381 Cover https://www.degruyter.com/cover/covers/9783110461381.jpg |
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English |
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author |
Dinnebier, Robert E. , Dinnebier, Robert E. , Evans, John S.O., Leineweber, Andreas , |
spellingShingle |
Dinnebier, Robert E. , Dinnebier, Robert E. , Evans, John S.O., Leineweber, Andreas , Rietveld Refinement : Practical Powder Diffraction Pattern Analysis using TOPAS / De Gruyter STEM Frontmatter -- Preface -- Contents -- 1. The powder diffraction method -- 2. The Rietveld method -- 3. Structure independent fitting -- 4. Peak shapes: Instrument o microstructure -- 5. Quantitative phase analysis -- 6. Restraints, constraints and rigid bodies -- 7. Solving crystal structures using the Rietveld method -- 8. Symmetry mode refinements -- 9. Magnetic refinements -- 10. Stacking disorder -- 11. Total scattering methods -- 12. Multiple data sets -- 13. Appendix: Mathematical basics -- Index |
author_facet |
Dinnebier, Robert E. , Dinnebier, Robert E. , Evans, John S.O., Leineweber, Andreas , Evans, John S.O., Evans, John S.O., Leineweber, Andreas , Leineweber, Andreas , |
author_variant |
r e d re red r e d re red j s e js jse a l al |
author_role |
VerfasserIn VerfasserIn VerfasserIn VerfasserIn |
author2 |
Evans, John S.O., Evans, John S.O., Leineweber, Andreas , Leineweber, Andreas , |
author2_variant |
j s e js jse a l al |
author2_role |
VerfasserIn VerfasserIn VerfasserIn VerfasserIn |
author_sort |
Dinnebier, Robert E. , |
title |
Rietveld Refinement : Practical Powder Diffraction Pattern Analysis using TOPAS / |
title_sub |
Practical Powder Diffraction Pattern Analysis using TOPAS / |
title_full |
Rietveld Refinement : Practical Powder Diffraction Pattern Analysis using TOPAS / Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans. |
title_fullStr |
Rietveld Refinement : Practical Powder Diffraction Pattern Analysis using TOPAS / Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans. |
title_full_unstemmed |
Rietveld Refinement : Practical Powder Diffraction Pattern Analysis using TOPAS / Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans. |
title_auth |
Rietveld Refinement : Practical Powder Diffraction Pattern Analysis using TOPAS / |
title_alt |
Frontmatter -- Preface -- Contents -- 1. The powder diffraction method -- 2. The Rietveld method -- 3. Structure independent fitting -- 4. Peak shapes: Instrument o microstructure -- 5. Quantitative phase analysis -- 6. Restraints, constraints and rigid bodies -- 7. Solving crystal structures using the Rietveld method -- 8. Symmetry mode refinements -- 9. Magnetic refinements -- 10. Stacking disorder -- 11. Total scattering methods -- 12. Multiple data sets -- 13. Appendix: Mathematical basics -- Index |
title_new |
Rietveld Refinement : |
title_sort |
rietveld refinement : practical powder diffraction pattern analysis using topas / |
series |
De Gruyter STEM |
series2 |
De Gruyter STEM |
publisher |
De Gruyter, |
publishDate |
2018 |
physical |
1 online resource (XVI, 331 p.) |
contents |
Frontmatter -- Preface -- Contents -- 1. The powder diffraction method -- 2. The Rietveld method -- 3. Structure independent fitting -- 4. Peak shapes: Instrument o microstructure -- 5. Quantitative phase analysis -- 6. Restraints, constraints and rigid bodies -- 7. Solving crystal structures using the Rietveld method -- 8. Symmetry mode refinements -- 9. Magnetic refinements -- 10. Stacking disorder -- 11. Total scattering methods -- 12. Multiple data sets -- 13. Appendix: Mathematical basics -- Index |
isbn |
9783110461381 9783110719567 9783110616859 9783110604252 9783110603255 9783110604221 9783110603224 9783110461404 9783110456219 |
callnumber-first |
Q - Science |
callnumber-subject |
QD - Chemistry |
callnumber-label |
QD945 |
callnumber-sort |
QD 3945 D56 42019 |
url |
https://doi.org/10.1515/9783110461381 https://www.degruyter.com/isbn/9783110461381 https://www.degruyter.com/cover/covers/9783110461381.jpg |
illustrated |
Not Illustrated |
dewey-hundreds |
500 - Science |
dewey-tens |
540 - Chemistry |
dewey-ones |
548 - Crystallography |
dewey-full |
548.83 |
dewey-sort |
3548.83 |
dewey-raw |
548.83 |
dewey-search |
548.83 |
doi_str_mv |
10.1515/9783110461381 |
oclc_num |
1083592837 |
work_keys_str_mv |
AT dinnebierroberte rietveldrefinementpracticalpowderdiffractionpatternanalysisusingtopas AT evansjohnso rietveldrefinementpracticalpowderdiffractionpatternanalysisusingtopas AT leineweberandreas rietveldrefinementpracticalpowderdiffractionpatternanalysisusingtopas |
status_str |
n |
ids_txt_mv |
(DE-B1597)461879 (OCoLC)1083592837 |
carrierType_str_mv |
cr |
hierarchy_parent_title |
Title is part of eBook package: De Gruyter DG Plus eBook-Package 2019 Title is part of eBook package: De Gruyter EBOOK PACKAGE COMPLETE DG 2019 English Title is part of eBook package: De Gruyter EBOOK PACKAGE COMPLETE 2018 English Title is part of eBook package: De Gruyter EBOOK PACKAGE COMPLETE 2018 Title is part of eBook package: De Gruyter EBOOK PACKAGE Physics, Chem., Mat.Sc, Geosc 2018 English Title is part of eBook package: De Gruyter EBOOK PACKAGE Physics, Chemistry, Materials Sc, Geosc 2018 |
is_hierarchy_title |
Rietveld Refinement : Practical Powder Diffraction Pattern Analysis using TOPAS / |
container_title |
Title is part of eBook package: De Gruyter DG Plus eBook-Package 2019 |
author2_original_writing_str_mv |
noLinkedField noLinkedField noLinkedField noLinkedField |
_version_ |
1770177621559083008 |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04783nam a22008415i 4500</leader><controlfield tag="001">9783110461381</controlfield><controlfield tag="003">DE-B1597</controlfield><controlfield tag="005">20210830012106.0</controlfield><controlfield tag="006">m|||||o||d||||||||</controlfield><controlfield tag="007">cr || ||||||||</controlfield><controlfield tag="008">210830t20182019gw fo d z eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783110461381</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1515/9783110461381</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-B1597)461879</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1083592837</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-B1597</subfield><subfield code="b">eng</subfield><subfield code="c">DE-B1597</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">DE</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QD945</subfield><subfield code="b">.D56 2019</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">SCI077000</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">548.83</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 9900</subfield><subfield code="2">rvk</subfield><subfield code="0">(DE-625)rvk/147245:253</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Dinnebier, Robert E. , </subfield><subfield code="e">author.</subfield><subfield code="4">aut</subfield><subfield code="4">http://id.loc.gov/vocabulary/relators/aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Rietveld Refinement :</subfield><subfield code="b">Practical Powder Diffraction Pattern Analysis using TOPAS /</subfield><subfield code="c">Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin ;</subfield><subfield code="a">Boston : </subfield><subfield code="b">De Gruyter, </subfield><subfield code="c">[2018]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">©2019</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (XVI, 331 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="347" ind1=" " ind2=" "><subfield code="a">text file</subfield><subfield code="b">PDF</subfield><subfield code="2">rda</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">De Gruyter STEM</subfield></datafield><datafield tag="505" ind1="0" ind2="0"><subfield code="t">Frontmatter -- </subfield><subfield code="t">Preface -- </subfield><subfield code="t">Contents -- </subfield><subfield code="t">1. The powder diffraction method -- </subfield><subfield code="t">2. The Rietveld method -- </subfield><subfield code="t">3. Structure independent fitting -- </subfield><subfield code="t">4. Peak shapes: Instrument o microstructure -- </subfield><subfield code="t">5. Quantitative phase analysis -- </subfield><subfield code="t">6. Restraints, constraints and rigid bodies -- </subfield><subfield code="t">7. Solving crystal structures using the Rietveld method -- </subfield><subfield code="t">8. Symmetry mode refinements -- </subfield><subfield code="t">9. Magnetic refinements -- </subfield><subfield code="t">10. Stacking disorder -- </subfield><subfield code="t">11. Total scattering methods -- </subfield><subfield code="t">12. Multiple data sets -- </subfield><subfield code="t">13. Appendix: Mathematical basics -- </subfield><subfield code="t">Index</subfield></datafield><datafield tag="506" ind1="0" ind2=" "><subfield code="a">restricted access</subfield><subfield code="u">http://purl.org/coar/access_right/c_16ec</subfield><subfield code="f">online access with authorization</subfield><subfield code="2">star</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.</subfield></datafield><datafield tag="538" ind1=" " ind2=" "><subfield code="a">Mode of access: Internet via World Wide Web.</subfield></datafield><datafield tag="546" ind1=" " ind2=" "><subfield code="a">In English.</subfield></datafield><datafield tag="588" ind1="0" ind2=" "><subfield code="a">Description based on online resource; title from PDF title page (publisher's Web site, viewed 30. Aug 2021)</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Crystallography.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Rietveld method.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">X-rays</subfield><subfield code="x">Diffraction.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Condensed Matter.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Evans, John S.O., </subfield><subfield code="e">author.</subfield><subfield code="4">aut</subfield><subfield code="4">http://id.loc.gov/vocabulary/relators/aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Leineweber, Andreas , </subfield><subfield code="e">author.</subfield><subfield code="4">aut</subfield><subfield code="4">http://id.loc.gov/vocabulary/relators/aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Title is part of eBook package:</subfield><subfield code="d">De Gruyter</subfield><subfield code="t">DG Plus eBook-Package 2019</subfield><subfield code="z">9783110719567</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Title is part of eBook package:</subfield><subfield code="d">De Gruyter</subfield><subfield code="t">EBOOK PACKAGE COMPLETE DG 2019 English</subfield><subfield code="z">9783110616859</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Title is part of eBook package:</subfield><subfield code="d">De Gruyter</subfield><subfield code="t">EBOOK PACKAGE COMPLETE 2018 English</subfield><subfield code="z">9783110604252</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Title is part of eBook package:</subfield><subfield code="d">De Gruyter</subfield><subfield code="t">EBOOK PACKAGE COMPLETE 2018</subfield><subfield code="z">9783110603255</subfield><subfield code="o">ZDB-23-DGG</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Title is part of eBook package:</subfield><subfield code="d">De Gruyter</subfield><subfield code="t">EBOOK PACKAGE Physics, Chem., Mat.Sc, Geosc 2018 English</subfield><subfield code="z">9783110604221</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Title is part of eBook package:</subfield><subfield code="d">De Gruyter</subfield><subfield code="t">EBOOK PACKAGE Physics, Chemistry, Materials Sc, Geosc 2018</subfield><subfield code="z">9783110603224</subfield><subfield code="o">ZDB-23-DPC</subfield></datafield><datafield tag="776" ind1="0" ind2=" "><subfield code="c">EPUB</subfield><subfield code="z">9783110461404</subfield></datafield><datafield tag="776" ind1="0" ind2=" "><subfield code="c">print</subfield><subfield code="z">9783110456219</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1515/9783110461381</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://www.degruyter.com/isbn/9783110461381</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="3">Cover</subfield><subfield code="u">https://www.degruyter.com/cover/covers/9783110461381.jpg</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">978-3-11-060422-1 EBOOK PACKAGE Physics, Chem., Mat.Sc, Geosc 2018 English</subfield><subfield code="b">2018</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">978-3-11-060425-2 EBOOK PACKAGE COMPLETE 2018 English</subfield><subfield code="b">2018</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">978-3-11-061685-9 EBOOK PACKAGE COMPLETE DG 2019 English</subfield><subfield code="b">2019</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">978-3-11-071956-7 DG Plus eBook-Package 2019</subfield><subfield code="b">2019</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">EBA_CL_MTPY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">EBA_DGALL</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">EBA_EBKALL</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">EBA_ECL_MTPY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">EBA_EEBKALL</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">EBA_ESTMALL</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">EBA_STMALL</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV-deGruyter-alles</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">PDA12STME</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">PDA13ENGE</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">PDA18STMEE</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">PDA5EBK</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-23-DGG</subfield><subfield code="b">2017</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-23-DPC</subfield><subfield code="b">2018</subfield></datafield></record></collection> |