Atomic force microscopy : exploring basic modes and advanced applications / / Greg Haugstad.

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Year of Publication:2012
Language:English
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Physical Description:xxii, 464 p. :; ill.
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id 500894402
ctrlnum (MiAaPQ)500894402
(Au-PeEL)EBL894402
(CaPaEBR)ebr10606048
(CaONFJC)MIL395852
(OCoLC)812067151
collection bib_alma
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01333nam a2200361Ia 4500</leader><controlfield tag="001">500894402</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">120302s2012 njua sb 001 0 eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="z"> 2012003429</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9780470638828</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118360699 (electronic bk.)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)500894402</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL894402</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr10606048</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL395852</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)812067151</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QH212.A78</subfield><subfield code="b">H38 2012</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620/.5</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Haugstad, Greg,</subfield><subfield code="d">1963-</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Atomic force microscopy</subfield><subfield code="h">[electronic resource] :</subfield><subfield code="b">exploring basic modes and advanced applications /</subfield><subfield code="c">Greg Haugstad.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Hoboken, N.J. :</subfield><subfield code="b">John Wiley &amp; Sons,</subfield><subfield code="c">c2012.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxii, 464 p. :</subfield><subfield code="b">ill.</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index.</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Atomic force microscopy.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Scanning proble microscopy.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=894402</subfield><subfield code="z">Click to View</subfield></datafield></record></collection>
record_format marc
spelling Haugstad, Greg, 1963-
Atomic force microscopy [electronic resource] : exploring basic modes and advanced applications / Greg Haugstad.
Hoboken, N.J. : John Wiley & Sons, c2012.
xxii, 464 p. : ill.
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Atomic force microscopy.
Scanning proble microscopy.
Electronic books.
ProQuest (Firm)
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=894402 Click to View
language English
format Electronic
eBook
author Haugstad, Greg, 1963-
spellingShingle Haugstad, Greg, 1963-
Atomic force microscopy exploring basic modes and advanced applications /
author_facet Haugstad, Greg, 1963-
ProQuest (Firm)
ProQuest (Firm)
author_variant g h gh
author2 ProQuest (Firm)
author2_role TeilnehmendeR
author_corporate ProQuest (Firm)
author_sort Haugstad, Greg, 1963-
title Atomic force microscopy exploring basic modes and advanced applications /
title_sub exploring basic modes and advanced applications /
title_full Atomic force microscopy [electronic resource] : exploring basic modes and advanced applications / Greg Haugstad.
title_fullStr Atomic force microscopy [electronic resource] : exploring basic modes and advanced applications / Greg Haugstad.
title_full_unstemmed Atomic force microscopy [electronic resource] : exploring basic modes and advanced applications / Greg Haugstad.
title_auth Atomic force microscopy exploring basic modes and advanced applications /
title_new Atomic force microscopy
title_sort atomic force microscopy exploring basic modes and advanced applications /
publisher John Wiley & Sons,
publishDate 2012
physical xxii, 464 p. : ill.
isbn 9781118360699 (electronic bk.)
callnumber-first Q - Science
callnumber-subject QH - Natural History and Biology
callnumber-label QH212
callnumber-sort QH 3212 A78 H38 42012
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=894402
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 620 - Engineering & allied operations
dewey-full 620/.5
dewey-sort 3620 15
dewey-raw 620/.5
dewey-search 620/.5
oclc_num 812067151
work_keys_str_mv AT haugstadgreg atomicforcemicroscopyexploringbasicmodesandadvancedapplications
AT proquestfirm atomicforcemicroscopyexploringbasicmodesandadvancedapplications
status_str n
ids_txt_mv (MiAaPQ)500894402
(Au-PeEL)EBL894402
(CaPaEBR)ebr10606048
(CaONFJC)MIL395852
(OCoLC)812067151
is_hierarchy_title Atomic force microscopy exploring basic modes and advanced applications /
author2_original_writing_str_mv noLinkedField
_version_ 1792330729079701504