Reliability and radiation effects in compound semiconductors / Allan Johnston.
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Year of Publication: | 2010 |
Language: | English |
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Physical Description: | xii, 363 p. :; ill. |
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100 | 1 | |a Johnston, Allan. | |
245 | 1 | 0 | |a Reliability and radiation effects in compound semiconductors |h [electronic resource] / |c Allan Johnston. |
260 | |a Hackensack, N.J. : |b World Scientific, |c 2010. | ||
300 | |a xii, 363 p. : |b ill. | ||
504 | |a Includes bibliographical references and index. | ||
533 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
650 | 0 | |a Compound semiconductors. | |
655 | 4 | |a Electronic books. | |
710 | 2 | |a ProQuest (Firm) | |
856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=731279 |z Click to View |