Technology Assessment in a Globalized World : : Facing the Challenges of Transnational Technology Governance.
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| Place / Publishing House: | Cham : : Springer International Publishing AG,, 2023. Ã2023. |
| Year of Publication: | 2023 |
| Edition: | 1st ed. |
| Language: | English |
| Online Access: | |
| Physical Description: | 1 online resource (272 pages) |
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| id |
5007174910 |
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| ctrlnum |
(MiAaPQ)5007174910 (Au-PeEL)EBL7174910 (OCoLC)1358406194 |
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bib_alma |
| record_format |
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| spelling |
Hennen, Leonhard. Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance. 1st ed. Cham : Springer International Publishing AG, 2023. Ã2023. 1 online resource (272 pages) text txt rdacontent computer c rdamedia online resource cr rdacarrier Description based on publisher supplied metadata and other sources. Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries. Electronic books. Hahn, Julia. Ladikas, Miltos. Lindner, Ralf. Peissl, Walter. van Est, Rinie. Print version: Hennen, Leonhard Technology Assessment in a Globalized World Cham : Springer International Publishing AG,c2023 9783031106163 ProQuest (Firm) https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=7174910 Click to View |
| language |
English |
| format |
eBook |
| author |
Hennen, Leonhard. |
| spellingShingle |
Hennen, Leonhard. Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance. |
| author_facet |
Hennen, Leonhard. Hahn, Julia. Ladikas, Miltos. Lindner, Ralf. Peissl, Walter. van Est, Rinie. |
| author_variant |
l h lh |
| author2 |
Hahn, Julia. Ladikas, Miltos. Lindner, Ralf. Peissl, Walter. van Est, Rinie. |
| author2_variant |
j h jh m l ml r l rl w p wp e r v er erv |
| author2_role |
TeilnehmendeR TeilnehmendeR TeilnehmendeR TeilnehmendeR TeilnehmendeR |
| author_sort |
Hennen, Leonhard. |
| title |
Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance. |
| title_sub |
Facing the Challenges of Transnational Technology Governance. |
| title_full |
Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance. |
| title_fullStr |
Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance. |
| title_full_unstemmed |
Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance. |
| title_auth |
Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance. |
| title_new |
Technology Assessment in a Globalized World : |
| title_sort |
technology assessment in a globalized world : facing the challenges of transnational technology governance. |
| publisher |
Springer International Publishing AG, |
| publishDate |
2023 |
| physical |
1 online resource (272 pages) |
| edition |
1st ed. |
| isbn |
9783031106170 9783031106163 |
| callnumber-first |
J - Political Science |
| callnumber-subject |
JF - Public Administration |
| callnumber-label |
JF20-2112 |
| callnumber-sort |
JF 220 42112 |
| genre |
Electronic books. |
| genre_facet |
Electronic books. |
| url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=7174910 |
| illustrated |
Not Illustrated |
| oclc_num |
1358406194 |
| work_keys_str_mv |
AT hennenleonhard technologyassessmentinaglobalizedworldfacingthechallengesoftransnationaltechnologygovernance AT hahnjulia technologyassessmentinaglobalizedworldfacingthechallengesoftransnationaltechnologygovernance AT ladikasmiltos technologyassessmentinaglobalizedworldfacingthechallengesoftransnationaltechnologygovernance AT lindnerralf technologyassessmentinaglobalizedworldfacingthechallengesoftransnationaltechnologygovernance AT peisslwalter technologyassessmentinaglobalizedworldfacingthechallengesoftransnationaltechnologygovernance AT vanestrinie technologyassessmentinaglobalizedworldfacingthechallengesoftransnationaltechnologygovernance |
| status_str |
n |
| ids_txt_mv |
(MiAaPQ)5007174910 (Au-PeEL)EBL7174910 (OCoLC)1358406194 |
| carrierType_str_mv |
cr |
| is_hierarchy_title |
Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance. |
| author2_original_writing_str_mv |
noLinkedField noLinkedField noLinkedField noLinkedField noLinkedField |
| marc_error |
Info : Unimarc and ISO-8859-1 translations identical, choosing ISO-8859-1. --- [ 856 : z ] |
| _version_ |
1792331065565642753 |
| fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01680nam a22004213i 4500</leader><controlfield tag="001">5007174910</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20240229073848.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cnu||||||||</controlfield><controlfield tag="008">240229s2023 xx o ||||0 eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783031106170</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9783031106163</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)5007174910</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL7174910</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1358406194</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="e">pn</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">JF20-2112</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Hennen, Leonhard.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Technology Assessment in a Globalized World :</subfield><subfield code="b">Facing the Challenges of Transnational Technology Governance.</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham :</subfield><subfield code="b">Springer International Publishing AG,</subfield><subfield code="c">2023.</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">Ã2023.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (272 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on publisher supplied metadata and other sources.</subfield></datafield><datafield tag="590" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries. </subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hahn, Julia.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ladikas, Miltos.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Lindner, Ralf.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Peissl, Walter.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">van Est, Rinie.</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="a">Hennen, Leonhard</subfield><subfield code="t">Technology Assessment in a Globalized World</subfield><subfield code="d">Cham : Springer International Publishing AG,c2023</subfield><subfield code="z">9783031106163</subfield></datafield><datafield tag="797" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=7174910</subfield><subfield code="z">Click to View</subfield></datafield></record></collection> |