Failure analysis : a practical guide for manufacturers of electronic components and systems / / Marius I. Bazu, Titu-Marius I. Bajenescu.
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Superior document: | Wiley series in quality & reliability engineering |
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Year of Publication: | 2011 |
Language: | English |
Series: | Wiley series in quality and reliability engineering.
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Physical Description: | xxii, 317 p. :; ill. |
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(MiAaPQ)500675196 (Au-PeEL)EBL675196 (CaPaEBR)ebr10510634 (CaONFJC)MIL340520 (OCoLC)742333202 |
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Bazu, M. I. (Marius I.), 1948- Failure analysis [electronic resource] : a practical guide for manufacturers of electronic components and systems / Marius I. Bazu, Titu-Marius I. Bajenescu. Chichester, West Sussex, U.K. : Wiley, c2011. xxii, 317 p. : ill. Wiley series in quality & reliability engineering Includes bibliographical references and index. Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Electronic apparatus and appliances Reliability. Electronic systems Testing. System failures (Engineering) Prevention. Electronic books. Bajenescu, Titu I., 1938- ProQuest (Firm) Wiley series in quality and reliability engineering. https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=675196 Click to View |
language |
English |
format |
Electronic eBook |
author |
Bazu, M. I. 1948- |
spellingShingle |
Bazu, M. I. 1948- Failure analysis a practical guide for manufacturers of electronic components and systems / Wiley series in quality & reliability engineering |
author_facet |
Bazu, M. I. 1948- Bajenescu, Titu I., 1938- ProQuest (Firm) ProQuest (Firm) |
author_variant |
m i b mi mib |
author_fuller |
(Marius I.), |
author2 |
Bajenescu, Titu I., 1938- ProQuest (Firm) |
author2_variant |
t i b ti tib |
author2_role |
TeilnehmendeR TeilnehmendeR |
author_corporate |
ProQuest (Firm) |
author_sort |
Bazu, M. I. 1948- |
title |
Failure analysis a practical guide for manufacturers of electronic components and systems / |
title_sub |
a practical guide for manufacturers of electronic components and systems / |
title_full |
Failure analysis [electronic resource] : a practical guide for manufacturers of electronic components and systems / Marius I. Bazu, Titu-Marius I. Bajenescu. |
title_fullStr |
Failure analysis [electronic resource] : a practical guide for manufacturers of electronic components and systems / Marius I. Bazu, Titu-Marius I. Bajenescu. |
title_full_unstemmed |
Failure analysis [electronic resource] : a practical guide for manufacturers of electronic components and systems / Marius I. Bazu, Titu-Marius I. Bajenescu. |
title_auth |
Failure analysis a practical guide for manufacturers of electronic components and systems / |
title_new |
Failure analysis |
title_sort |
failure analysis a practical guide for manufacturers of electronic components and systems / |
series |
Wiley series in quality & reliability engineering |
series2 |
Wiley series in quality & reliability engineering |
publisher |
Wiley, |
publishDate |
2011 |
physical |
xxii, 317 p. : ill. |
callnumber-first |
T - Technology |
callnumber-subject |
TK - Electrical and Nuclear Engineering |
callnumber-label |
TK7870 |
callnumber-sort |
TK 47870.23 B395 42011 |
genre |
Electronic books. |
genre_facet |
Electronic books. |
url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=675196 |
illustrated |
Illustrated |
dewey-hundreds |
600 - Technology |
dewey-tens |
620 - Engineering |
dewey-ones |
621 - Applied physics |
dewey-full |
621.381 |
dewey-sort |
3621.381 |
dewey-raw |
621.381 |
dewey-search |
621.381 |
oclc_num |
742333202 |
work_keys_str_mv |
AT bazumi failureanalysisapracticalguideformanufacturersofelectroniccomponentsandsystems AT bajenescutitui failureanalysisapracticalguideformanufacturersofelectroniccomponentsandsystems AT proquestfirm failureanalysisapracticalguideformanufacturersofelectroniccomponentsandsystems |
status_str |
n |
ids_txt_mv |
(MiAaPQ)500675196 (Au-PeEL)EBL675196 (CaPaEBR)ebr10510634 (CaONFJC)MIL340520 (OCoLC)742333202 |
hierarchy_parent_title |
Wiley series in quality & reliability engineering |
is_hierarchy_title |
Failure analysis a practical guide for manufacturers of electronic components and systems / |
container_title |
Wiley series in quality & reliability engineering |
author2_original_writing_str_mv |
noLinkedField noLinkedField |
_version_ |
1792330711166877697 |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01668nam a2200421Ia 4500</leader><controlfield tag="001">500675196</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">101207s2011 enka sb 001 0 eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="z"> 2010046383</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">0470748249</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9780470748244</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9781119990109</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)500675196</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL675196</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr10510634</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL340520</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)742333202</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TK7870.23</subfield><subfield code="b">.B395 2011</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">621.381</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bazu, M. I.</subfield><subfield code="q">(Marius I.),</subfield><subfield code="d">1948-</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Failure analysis</subfield><subfield code="h">[electronic resource] :</subfield><subfield code="b">a practical guide for manufacturers of electronic components and systems /</subfield><subfield code="c">Marius I. Bazu, Titu-Marius I. Bajenescu.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Chichester, West Sussex, U.K. :</subfield><subfield code="b">Wiley,</subfield><subfield code="c">c2011.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxii, 317 p. :</subfield><subfield code="b">ill.</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Wiley series in quality & reliability engineering</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index.</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Reliability.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electronic systems</subfield><subfield code="x">Testing.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">System failures (Engineering)</subfield><subfield code="x">Prevention.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bajenescu, Titu I.,</subfield><subfield code="d">1938-</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Wiley series in quality and reliability engineering.</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=675196</subfield><subfield code="z">Click to View</subfield></datafield></record></collection> |