On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / / Andrej Rumiantsev.

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Bibliographic Details
Superior document:River publishers series in electronic materials and devices
VerfasserIn:
Place / Publishing House:Gistrup, Denmark ;, Delft, Netherlands : : River Publishers,, [2019]
2019
Year of Publication:2019
Language:English
Series:River Publishers series in electronic materials and devices.
Online Access:
Physical Description:1 online resource (278 pages).
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ISBN:9788770221122
9788770221115 (ebook)
Hierarchical level:Monograph
Statement of Responsibility: Andrej Rumiantsev.