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Bibliographic Details
VerfasserIn:	Jalabert, Denis,
Place / Publishing House:	London, [England] ;, New York : : Routledge,, 2017. 2008
Year of Publication:	2017
Language:	English
Online Access:	https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4983681
Physical Description:	1 online resource (285 pages)
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100	1		\|a Jalabert, Denis, \|e author.
245	1	0	\|a Swift ion beam analysis in nanosciences / \|c Denis Jalabert.
264		1	\|a London, [England] ; \|a New York : \|b Routledge, \|c 2017.
264		4	\|c 2008
300			\|a 1 online resource (285 pages)
336			\|a text \|2 rdacontent
337			\|a computer \|2 rdamedia
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588			\|a Description based on online resource; title from PDF title page (ebrary, viewed September 16, 2017).
590			\|a Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650		0	\|a Nanotechnology.
655		4	\|a Electronic books.
776	0	8	\|i Print version: \|a Jalabert,Denis. \|t Swift ion beam analysis in nanosciences. \|d London, [England] ; New York : Routledge, 2017 c2008 \|h 217 pages \|z 9781848215771
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856	4	0	\|u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4983681 \|z Click to View