Big data war : : how to survive global big data competition / / Patrick H. Park.

Written by Patrick H. Park, an author of Brain Work (Korea, 2014). The book mainly focuses on why data analytics fails in business. It provides an objective analysis and root causes of the phenomenon, instead of abstract criticism of utility of data analytics. The author, then, explains in detail on...

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Bibliographic Details
Superior document:Big data and business analytics collection,
VerfasserIn:
Place / Publishing House:New York, New York (222 East 46th Street, New York, NY 10017) : : Business Expert Press,, 2016.
Year of Publication:2016
Edition:First edition.
Language:English
Series:Big data and business analytics collection.
Online Access:
Physical Description:1 online resource (x, 195 pages)
Notes:Includes index.
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Summary:Written by Patrick H. Park, an author of Brain Work (Korea, 2014). The book mainly focuses on why data analytics fails in business. It provides an objective analysis and root causes of the phenomenon, instead of abstract criticism of utility of data analytics. The author, then, explains in detail on how companies can survive and win the global big data competition, based on actual cases of companies. Having established the execution and performance-oriented big data methodology based on over 10 years of experience in the field as an authority in big data strategy, the author identifies core principles of data analytics using case analysis of failures and successes of actual companies. Moreover, he endeavors to share with readers the principles regarding how innovative global companies became successful through utilization of big data. This book is a quintessential big data analytics, in which the author's know-how from direct and indirect experiences is condensed. How do we survive at this big data war in which Facebook in SNS, Amazon in e-commerce, and Google in search expand their platforms to other areas based on their respective distinct markets? The answer can be found in this book.
ISBN:9781631575600
9781631575617
ISSN:2333-6757
Access:Access restricted to authorized users and institutions.
Hierarchical level:Monograph
Statement of Responsibility: Patrick H. Park.