ESD : failure mechanisms and models / / Steven H. Voldman.

Saved in:
Bibliographic Details
:
TeilnehmendeR:
Year of Publication:2009
Language:English
Online Access:
Physical Description:xxiv, 384 p.
Tags: Add Tag
No Tags, Be the first to tag this record!
id 500454456
ctrlnum (MiAaPQ)500454456
(Au-PeEL)EBL454456
(CaPaEBR)ebr10317806
(CaONFJC)MIL223713
(OCoLC)609844472
collection bib_alma
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01483nam a2200409Ia 4500</leader><controlfield tag="001">500454456</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">090423s2009 enk sb 001 0 eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="z"> 2009015206</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9780470511374 (cloth)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)500454456</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL454456</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr10317806</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL223713</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)609844472</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TK7871.852</subfield><subfield code="b">.V65 2009</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">621.381</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Voldman, Steven H.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ESD</subfield><subfield code="h">[electronic resource] :</subfield><subfield code="b">failure mechanisms and models /</subfield><subfield code="c">Steven H. Voldman.</subfield></datafield><datafield tag="246" ind1="3" ind2=" "><subfield code="a">Electrostatic discharge</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Chichester, West Sussex, U.K. ;</subfield><subfield code="a">Hoboken, NJ :</subfield><subfield code="b">J. Wiley,</subfield><subfield code="c">2009.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxiv, 384 p.</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index.</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Semiconductors</subfield><subfield code="x">Failures.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Integrated circuits</subfield><subfield code="x">Protection.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Integrated circuits</subfield><subfield code="x">Reliability.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electric discharges.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electrostatics.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=454456</subfield><subfield code="z">Click to View</subfield></datafield></record></collection>
record_format marc
spelling Voldman, Steven H.
ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman.
Electrostatic discharge
Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009.
xxiv, 384 p.
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Semiconductors Failures.
Integrated circuits Protection.
Integrated circuits Testing.
Integrated circuits Reliability.
Electric discharges.
Electrostatics.
Electronic books.
ProQuest (Firm)
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=454456 Click to View
language English
format Electronic
eBook
author Voldman, Steven H.
spellingShingle Voldman, Steven H.
ESD failure mechanisms and models /
author_facet Voldman, Steven H.
ProQuest (Firm)
ProQuest (Firm)
author_variant s h v sh shv
author2 ProQuest (Firm)
author2_role TeilnehmendeR
author_corporate ProQuest (Firm)
author_sort Voldman, Steven H.
title ESD failure mechanisms and models /
title_sub failure mechanisms and models /
title_full ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman.
title_fullStr ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman.
title_full_unstemmed ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman.
title_auth ESD failure mechanisms and models /
title_alt Electrostatic discharge
title_new ESD
title_sort esd failure mechanisms and models /
publisher J. Wiley,
publishDate 2009
physical xxiv, 384 p.
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7871
callnumber-sort TK 47871.852 V65 42009
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=454456
illustrated Not Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.381
dewey-sort 3621.381
dewey-raw 621.381
dewey-search 621.381
oclc_num 609844472
work_keys_str_mv AT voldmanstevenh esdfailuremechanismsandmodels
AT proquestfirm esdfailuremechanismsandmodels
AT voldmanstevenh electrostaticdischarge
AT proquestfirm electrostaticdischarge
status_str n
ids_txt_mv (MiAaPQ)500454456
(Au-PeEL)EBL454456
(CaPaEBR)ebr10317806
(CaONFJC)MIL223713
(OCoLC)609844472
is_hierarchy_title ESD failure mechanisms and models /
author2_original_writing_str_mv noLinkedField
_version_ 1792330693097816065