ESD : failure mechanisms and models / / Steven H. Voldman.
Saved in:
: | |
---|---|
TeilnehmendeR: | |
Year of Publication: | 2009 |
Language: | English |
Online Access: | |
Physical Description: | xxiv, 384 p. |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
id |
500454456 |
---|---|
ctrlnum |
(MiAaPQ)500454456 (Au-PeEL)EBL454456 (CaPaEBR)ebr10317806 (CaONFJC)MIL223713 (OCoLC)609844472 |
collection |
bib_alma |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01483nam a2200409Ia 4500</leader><controlfield tag="001">500454456</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">090423s2009 enk sb 001 0 eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="z"> 2009015206</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9780470511374 (cloth)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)500454456</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL454456</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr10317806</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL223713</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)609844472</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TK7871.852</subfield><subfield code="b">.V65 2009</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">621.381</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Voldman, Steven H.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ESD</subfield><subfield code="h">[electronic resource] :</subfield><subfield code="b">failure mechanisms and models /</subfield><subfield code="c">Steven H. Voldman.</subfield></datafield><datafield tag="246" ind1="3" ind2=" "><subfield code="a">Electrostatic discharge</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Chichester, West Sussex, U.K. ;</subfield><subfield code="a">Hoboken, NJ :</subfield><subfield code="b">J. Wiley,</subfield><subfield code="c">2009.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxiv, 384 p.</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index.</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Semiconductors</subfield><subfield code="x">Failures.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Integrated circuits</subfield><subfield code="x">Protection.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Integrated circuits</subfield><subfield code="x">Reliability.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electric discharges.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electrostatics.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=454456</subfield><subfield code="z">Click to View</subfield></datafield></record></collection> |
record_format |
marc |
spelling |
Voldman, Steven H. ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman. Electrostatic discharge Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009. xxiv, 384 p. Includes bibliographical references and index. Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Semiconductors Failures. Integrated circuits Protection. Integrated circuits Testing. Integrated circuits Reliability. Electric discharges. Electrostatics. Electronic books. ProQuest (Firm) https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=454456 Click to View |
language |
English |
format |
Electronic eBook |
author |
Voldman, Steven H. |
spellingShingle |
Voldman, Steven H. ESD failure mechanisms and models / |
author_facet |
Voldman, Steven H. ProQuest (Firm) ProQuest (Firm) |
author_variant |
s h v sh shv |
author2 |
ProQuest (Firm) |
author2_role |
TeilnehmendeR |
author_corporate |
ProQuest (Firm) |
author_sort |
Voldman, Steven H. |
title |
ESD failure mechanisms and models / |
title_sub |
failure mechanisms and models / |
title_full |
ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman. |
title_fullStr |
ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman. |
title_full_unstemmed |
ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman. |
title_auth |
ESD failure mechanisms and models / |
title_alt |
Electrostatic discharge |
title_new |
ESD |
title_sort |
esd failure mechanisms and models / |
publisher |
J. Wiley, |
publishDate |
2009 |
physical |
xxiv, 384 p. |
callnumber-first |
T - Technology |
callnumber-subject |
TK - Electrical and Nuclear Engineering |
callnumber-label |
TK7871 |
callnumber-sort |
TK 47871.852 V65 42009 |
genre |
Electronic books. |
genre_facet |
Electronic books. |
url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=454456 |
illustrated |
Not Illustrated |
dewey-hundreds |
600 - Technology |
dewey-tens |
620 - Engineering |
dewey-ones |
621 - Applied physics |
dewey-full |
621.381 |
dewey-sort |
3621.381 |
dewey-raw |
621.381 |
dewey-search |
621.381 |
oclc_num |
609844472 |
work_keys_str_mv |
AT voldmanstevenh esdfailuremechanismsandmodels AT proquestfirm esdfailuremechanismsandmodels AT voldmanstevenh electrostaticdischarge AT proquestfirm electrostaticdischarge |
status_str |
n |
ids_txt_mv |
(MiAaPQ)500454456 (Au-PeEL)EBL454456 (CaPaEBR)ebr10317806 (CaONFJC)MIL223713 (OCoLC)609844472 |
is_hierarchy_title |
ESD failure mechanisms and models / |
author2_original_writing_str_mv |
noLinkedField |
_version_ |
1792330693097816065 |