Experimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing / / Jack W. Ekin.

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Year of Publication:2006
Language:English
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Physical Description:xxviii, 673 p. :; ill.
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id 500430810
ctrlnum (MiAaPQ)500430810
(Au-PeEL)EBL430810
(CaPaEBR)ebr10180288
(CaONFJC)MIL116038
(OCoLC)609831339
collection bib_alma
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01549nam a22004094a 4500</leader><controlfield tag="001">500430810</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">060327s2006 enka sb 001 0 eng </controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="z"> 2006010332</subfield></datafield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">GBA638505</subfield><subfield code="2">bnb</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="z">013442448</subfield><subfield code="2">Uk</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">0198570546 (alk. paper)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9780198570547 (alk. paper)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)500430810</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL430810</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr10180288</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL116038</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)609831339</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QC278</subfield><subfield code="b">.E45 2006</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">536/.54</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Ekin, J. W.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Experimental techniques for low-temperature measurements</subfield><subfield code="h">[electronic resource] :</subfield><subfield code="b">cryostat design, material properties, and superconductor critical-current testing /</subfield><subfield code="c">Jack W. Ekin.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Oxford ;</subfield><subfield code="a">New York :</subfield><subfield code="b">Oxford University Press,</subfield><subfield code="c">2006.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxviii, 673 p. :</subfield><subfield code="b">ill.</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index.</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Low temperatures</subfield><subfield code="x">Measurement.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Low temperatures</subfield><subfield code="x">Instruments.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Low temperature research.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Superconductors.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=430810</subfield><subfield code="z">Click to View</subfield></datafield></record></collection>
record_format marc
spelling Ekin, J. W.
Experimental techniques for low-temperature measurements [electronic resource] : cryostat design, material properties, and superconductor critical-current testing / Jack W. Ekin.
Oxford ; New York : Oxford University Press, 2006.
xxviii, 673 p. : ill.
Includes bibliographical references and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Low temperatures Measurement.
Low temperatures Instruments.
Low temperature research.
Superconductors.
Electronic books.
ProQuest (Firm)
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=430810 Click to View
language English
format Electronic
eBook
author Ekin, J. W.
spellingShingle Ekin, J. W.
Experimental techniques for low-temperature measurements cryostat design, material properties, and superconductor critical-current testing /
author_facet Ekin, J. W.
ProQuest (Firm)
ProQuest (Firm)
author_variant j w e jw jwe
author2 ProQuest (Firm)
author2_role TeilnehmendeR
author_corporate ProQuest (Firm)
author_sort Ekin, J. W.
title Experimental techniques for low-temperature measurements cryostat design, material properties, and superconductor critical-current testing /
title_sub cryostat design, material properties, and superconductor critical-current testing /
title_full Experimental techniques for low-temperature measurements [electronic resource] : cryostat design, material properties, and superconductor critical-current testing / Jack W. Ekin.
title_fullStr Experimental techniques for low-temperature measurements [electronic resource] : cryostat design, material properties, and superconductor critical-current testing / Jack W. Ekin.
title_full_unstemmed Experimental techniques for low-temperature measurements [electronic resource] : cryostat design, material properties, and superconductor critical-current testing / Jack W. Ekin.
title_auth Experimental techniques for low-temperature measurements cryostat design, material properties, and superconductor critical-current testing /
title_new Experimental techniques for low-temperature measurements
title_sort experimental techniques for low-temperature measurements cryostat design, material properties, and superconductor critical-current testing /
publisher Oxford University Press,
publishDate 2006
physical xxviii, 673 p. : ill.
callnumber-first Q - Science
callnumber-subject QC - Physics
callnumber-label QC278
callnumber-sort QC 3278 E45 42006
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=430810
illustrated Illustrated
dewey-hundreds 500 - Science
dewey-tens 530 - Physics
dewey-ones 536 - Heat
dewey-full 536/.54
dewey-sort 3536 254
dewey-raw 536/.54
dewey-search 536/.54
oclc_num 609831339
work_keys_str_mv AT ekinjw experimentaltechniquesforlowtemperaturemeasurementscryostatdesignmaterialpropertiesandsuperconductorcriticalcurrenttesting
AT proquestfirm experimentaltechniquesforlowtemperaturemeasurementscryostatdesignmaterialpropertiesandsuperconductorcriticalcurrenttesting
status_str n
ids_txt_mv (MiAaPQ)500430810
(Au-PeEL)EBL430810
(CaPaEBR)ebr10180288
(CaONFJC)MIL116038
(OCoLC)609831339
is_hierarchy_title Experimental techniques for low-temperature measurements cryostat design, material properties, and superconductor critical-current testing /
author2_original_writing_str_mv noLinkedField
_version_ 1792330689556774913