Advanced production testing of RF, SoC, and SiP devices / Joe Kelly, Michael Engelhardt.

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Bibliographic Details
Superior document:Artech House microwave library
:
TeilnehmendeR:
Year of Publication:2007
Language:English
Series:Artech House microwave library.
Online Access:
Physical Description:xx, 301 p. :; ill.
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100 1 |a Kelly, Joe. 
245 1 0 |a Advanced production testing of RF, SoC, and SiP devices  |h [electronic resource] /  |c Joe Kelly, Michael Engelhardt. 
260 |a Boston :  |b Artech House,  |c 2007. 
300 |a xx, 301 p. :  |b ill. 
490 1 |a Artech House microwave library 
504 |a Includes bibliographical references and index. 
533 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
650 0 |a Systems on a chip  |x Testing. 
650 0 |a Embedded computer systems. 
655 4 |a Electronic books. 
700 1 |a Engelhardt, M.  |q (Michael) 
710 2 |a ProQuest (Firm) 
830 0 |a Artech House microwave library. 
856 4 0 |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=338742  |z Click to View