Aberration-Corrected Analytical Electron Microscopy of Transition Metal Nitride and Silicon Nitride Multilayers.

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Bibliographic Details
Superior document:Linköping Studies in Science and Technology. Thesis Series ; v.1628
:
Place / Publishing House:Linköping : : Linkopings Universitet,, 2013.
{copy}2013.
Year of Publication:2013
Edition:1st ed.
Language:English
Series:Linköping Studies in Science and Technology. Thesis Series
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Physical Description:1 online resource (44 pages)
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