Fault injection techniques and tools for embedded systems reliability evaluation / edited by Alfredo Benso and Paolo Prinetto.

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Superior document:Frontiers in electronic testing ; 23
:
TeilnehmendeR:
Year of Publication:2003
Language:English
Series:Frontiers in electronic testing ; 23.
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Physical Description:xiv, 241 p. :; ill.
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id 5003036042
ctrlnum (MiAaPQ)5003036042
(Au-PeEL)EBL3036042
(CaPaEBR)ebr10078628
(OCoLC)923697010
collection bib_alma
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01512nam a2200385Ia 4500</leader><controlfield tag="001">5003036042</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">030814s2003 maua sb 000 0 eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="z"> 2003061871</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">1402075898 (alk. paper)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)5003036042</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL3036042</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr10078628</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)923697010</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TK7895.E42</subfield><subfield code="b">F38 2003</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">004.2/56</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="0" ind2="0"><subfield code="a">Fault injection techniques and tools for embedded systems reliability evaluation</subfield><subfield code="h">[electronic resource] /</subfield><subfield code="c">edited by Alfredo Benso and Paolo Prinetto.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Boston :</subfield><subfield code="b">Kluwer Academic Publishers,</subfield><subfield code="c">c2003.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiv, 241 p. :</subfield><subfield code="b">ill.</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Frontiers in electronic testing ;</subfield><subfield code="v">23</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (p. [231]-241).</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Embedded computer systems</subfield><subfield code="x">Testing.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Embedded computer systems</subfield><subfield code="x">Reliability.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Fault location (Engineering)</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Benso, Alfredo.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Prinetto, Paolo.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Frontiers in electronic testing ;</subfield><subfield code="v">23.</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3036042</subfield><subfield code="z">Click to View</subfield></datafield></record></collection>
record_format marc
spelling Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto.
Boston : Kluwer Academic Publishers, c2003.
xiv, 241 p. : ill.
Frontiers in electronic testing ; 23
Includes bibliographical references (p. [231]-241).
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Embedded computer systems Testing.
Embedded computer systems Reliability.
Fault location (Engineering)
Electronic books.
Benso, Alfredo.
Prinetto, Paolo.
ProQuest (Firm)
Frontiers in electronic testing ; 23.
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3036042 Click to View
language English
format Electronic
eBook
author2 Benso, Alfredo.
Prinetto, Paolo.
ProQuest (Firm)
author_facet Benso, Alfredo.
Prinetto, Paolo.
ProQuest (Firm)
ProQuest (Firm)
author2_variant a b ab
p p pp
author2_role TeilnehmendeR
TeilnehmendeR
TeilnehmendeR
author_corporate ProQuest (Firm)
author_sort Benso, Alfredo.
title Fault injection techniques and tools for embedded systems reliability evaluation
spellingShingle Fault injection techniques and tools for embedded systems reliability evaluation
Frontiers in electronic testing ;
title_full Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto.
title_fullStr Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto.
title_full_unstemmed Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto.
title_auth Fault injection techniques and tools for embedded systems reliability evaluation
title_new Fault injection techniques and tools for embedded systems reliability evaluation
title_sort fault injection techniques and tools for embedded systems reliability evaluation
series Frontiers in electronic testing ;
series2 Frontiers in electronic testing ;
publisher Kluwer Academic Publishers,
publishDate 2003
physical xiv, 241 p. : ill.
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7895
callnumber-sort TK 47895 E42 F38 42003
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3036042
illustrated Illustrated
dewey-hundreds 000 - Computer science, information & general works
dewey-tens 000 - Computer science, knowledge & systems
dewey-ones 004 - Data processing & computer science
dewey-full 004.2/56
dewey-sort 14.2 256
dewey-raw 004.2/56
dewey-search 004.2/56
oclc_num 923697010
work_keys_str_mv AT bensoalfredo faultinjectiontechniquesandtoolsforembeddedsystemsreliabilityevaluation
AT prinettopaolo faultinjectiontechniquesandtoolsforembeddedsystemsreliabilityevaluation
AT proquestfirm faultinjectiontechniquesandtoolsforembeddedsystemsreliabilityevaluation
status_str n
ids_txt_mv (MiAaPQ)5003036042
(Au-PeEL)EBL3036042
(CaPaEBR)ebr10078628
(OCoLC)923697010
hierarchy_parent_title Frontiers in electronic testing ; 23
hierarchy_sequence 23.
is_hierarchy_title Fault injection techniques and tools for embedded systems reliability evaluation
container_title Frontiers in electronic testing ; 23
author2_original_writing_str_mv noLinkedField
noLinkedField
noLinkedField
_version_ 1792330835339247616