Beam effects, surface topography, and depth profiling in surface analysis / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.
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| Superior document: | Methods of surface characterization ; v. 5 |
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| : | |
| TeilnehmendeR: | |
| Year of Publication: | 1998 |
| Language: | English |
| Series: | Methods of surface characterization ;
v. 5. |
| Online Access: | |
| Physical Description: | xix, 430 p. :; ill. |
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| Bibliography: | Includes bibliographical references and index. |
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| ISBN: | 0306458969 |
| Hierarchical level: | Monograph |
| Statement of Responsibility: | edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell. |