Scanning force microscopy : with applications to electric, magnetic, and atomic forces /

Scanning force microscopy : with applications to electric, magnetic, and atomic forces / / Dror Sarid.

Saved in:
Bibliographic Details
Superior document:Oxford series in optical and imaging sciences ; 5
:
ProQuest (Firm)
Sarid, Dror.
TeilnehmendeR:
ProQuest (Firm)
Year of Publication:1994
Edition:Rev. ed.
Language:English
Series:Oxford series in optical and imaging sciences ; 5.
Online Access:
Physical Description:xiii, 263 p. :; ill.
Tags: Add Tag
No Tags, Be the first to tag this record!
id 500241662
ctrlnum (MiAaPQ)500241662
(Au-PeEL)EBL241662
(CaPaEBR)ebr10087124
(CaONFJC)MIL44178
(OCoLC)475957730
collection bib_alma
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01365nam a2200349Ia 4500</leader><controlfield tag="001">500241662</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">940126s1994 nyua sb 001 0 eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)500241662</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL241662</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr10087124</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL44178</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)475957730</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QH212.S32</subfield><subfield code="b">S27 1994</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sarid, Dror.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning force microscopy</subfield><subfield code="h">[electronic resource] :</subfield><subfield code="b">with applications to electric, magnetic, and atomic forces /</subfield><subfield code="c">Dror Sarid.</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Rev. ed.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">New York :</subfield><subfield code="b">Oxford University Press,</subfield><subfield code="c">1994.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiii, 263 p. :</subfield><subfield code="b">ill.</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Oxford series in optical and imaging sciences ;</subfield><subfield code="v">5</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (p. 233-259) and index.</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Scanning force microscopy.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Surfaces (Physics)</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Oxford series in optical and imaging sciences ;</subfield><subfield code="v">5.</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=241662</subfield><subfield code="z">Click to View</subfield></datafield></record></collection>
record_format marc
spelling Sarid, Dror.
Scanning force microscopy [electronic resource] : with applications to electric, magnetic, and atomic forces / Dror Sarid.
Rev. ed.
New York : Oxford University Press, 1994.
xiii, 263 p. : ill.
Oxford series in optical and imaging sciences ; 5
Includes bibliographical references (p. 233-259) and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Scanning force microscopy.
Surfaces (Physics)
Electronic books.
ProQuest (Firm)
Oxford series in optical and imaging sciences ; 5.
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=241662 Click to View
language English
format Electronic
eBook
author Sarid, Dror.
spellingShingle Sarid, Dror.
Scanning force microscopy with applications to electric, magnetic, and atomic forces /
Oxford series in optical and imaging sciences ;
author_facet Sarid, Dror.
ProQuest (Firm)
ProQuest (Firm)
author_variant d s ds
author2 ProQuest (Firm)
author2_role TeilnehmendeR
author_corporate ProQuest (Firm)
author_sort Sarid, Dror.
title Scanning force microscopy with applications to electric, magnetic, and atomic forces /
title_sub with applications to electric, magnetic, and atomic forces /
title_full Scanning force microscopy [electronic resource] : with applications to electric, magnetic, and atomic forces / Dror Sarid.
title_fullStr Scanning force microscopy [electronic resource] : with applications to electric, magnetic, and atomic forces / Dror Sarid.
title_full_unstemmed Scanning force microscopy [electronic resource] : with applications to electric, magnetic, and atomic forces / Dror Sarid.
title_auth Scanning force microscopy with applications to electric, magnetic, and atomic forces /
title_new Scanning force microscopy
title_sort scanning force microscopy with applications to electric, magnetic, and atomic forces /
series Oxford series in optical and imaging sciences ;
series2 Oxford series in optical and imaging sciences ;
publisher Oxford University Press,
publishDate 1994
physical xiii, 263 p. : ill.
edition Rev. ed.
callnumber-first Q - Science
callnumber-subject QH - Natural History and Biology
callnumber-label QH212
callnumber-sort QH 3212 S32 S27 41994
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=241662
illustrated Illustrated
oclc_num 475957730
work_keys_str_mv AT sariddror scanningforcemicroscopywithapplicationstoelectricmagneticandatomicforces
AT proquestfirm scanningforcemicroscopywithapplicationstoelectricmagneticandatomicforces
status_str n
ids_txt_mv (MiAaPQ)500241662
(Au-PeEL)EBL241662
(CaPaEBR)ebr10087124
(CaONFJC)MIL44178
(OCoLC)475957730
hierarchy_parent_title Oxford series in optical and imaging sciences ; 5
hierarchy_sequence 5.
is_hierarchy_title Scanning force microscopy with applications to electric, magnetic, and atomic forces /
container_title Oxford series in optical and imaging sciences ; 5
author2_original_writing_str_mv noLinkedField
_version_ 1792330671487713281

Similar Items