Electron microscopy XIV : : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland / / edited by Danuta Stroz and Krystian Prusik.
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| Superior document: | Solid state phenomena, volumes 186 |
|---|---|
| : | |
| TeilnehmendeR: | |
| Place / Publishing House: | Durnten-Zurich, Switzerland ;, Enfield, NH, USA : : TTP,, [2012] 2012 |
| Year of Publication: | 2012 |
| Language: | English |
| Series: | Diffusion and defect data. Solid state phenomena ;
volumes 186. |
| Online Access: | |
| Physical Description: | 1 online resource (352 pages) :; illustrations (some color). |
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| 050 | 4 | |a QH212.E4 |b I57 2011 | |
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| 111 | 2 | |a International Conference on Electron Microscopy |n (14th : |d 2011 : |c Wisa, Poland), |j issuing body. | |
| 245 | 1 | 0 | |a Electron microscopy XIV : |b selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland / |c edited by Danuta Stroz and Krystian Prusik. |
| 246 | 3 | 0 | |a Electron microscopy 14 |
| 264 | 1 | |a Durnten-Zurich, Switzerland ; |a Enfield, NH, USA : |b TTP, |c [2012] | |
| 264 | 4 | |c 2012 | |
| 300 | |a 1 online resource (352 pages) : |b illustrations (some color). | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a computer |2 rdamedia | ||
| 338 | |a online resource |2 rdacarrier | ||
| 490 | 1 | |a Solid state phenomena, |x 1012-0394 ; |v volumes 186 | |
| 504 | |a Includes bibliographical references and indexes. | ||
| 588 | |a Description based on print version record. | ||
| 590 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Electron microscopy |v Congresses. | |
| 655 | 4 | |a Electronic books. | |
| 700 | 1 | |a Stroz, Danuta. | |
| 700 | 1 | |a Prusik, Krystian. | |
| 776 | 0 | 8 | |i Print version: |a International Conference on Electron Microscopy. |t Electron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland. |d Durnten-Zurich, Switzerland : TTP, [2012] |h xiii, 341 pages ; 25 cm. |k Solid state phenomena ; volumes 186 |z 9783037853818 |w (OCoLC)ocn801662615 |w (DLC) 2012538041 |
| 797 | 2 | |a ProQuest (Firm) | |
| 830 | 0 | |a Diffusion and defect data. |n Pt. B, |p Solid state phenomena ; |v volumes 186. | |
| 856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1872826 |z Click to View |