Low voltage electron microscopy : principles and applications / / edited by David C. Bell and Natasha Erdman.
"Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for curre...
Saved in:
| Superior document: | Royal Microscopical Society-John Wiley series |
|---|---|
| : | |
| TeilnehmendeR: | |
| Year of Publication: | 2013 |
| Language: | English |
| Series: | RMS-Wiley series.
|
| Online Access: | |
| Physical Description: | xiii, 203 p., [14] p. of plates :; ill. (some col.). |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| id |
5001120410 |
|---|---|
| ctrlnum |
(MiAaPQ)5001120410 (Au-PeEL)EBL1120410 (CaPaEBR)ebr10657802 (CaONFJC)MIL450073 (OCoLC)828299083 |
| collection |
bib_alma |
| record_format |
marc |
| spelling |
Low voltage electron microscopy [electronic resource] : principles and applications / edited by David C. Bell and Natasha Erdman. Hoboken : John Wiley & Sons Inc., 2013. xiii, 203 p., [14] p. of plates : ill. (some col.). Royal Microscopical Society-John Wiley series Includes bibliographical references and index. "Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"-- Provided by publisher. Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Electron microscopy Technique. Electronic books. Bell, D. C. (David C.) Erdman, Natasha. ProQuest (Firm) RMS-Wiley series. https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1120410 Click to View |
| language |
English |
| format |
Electronic eBook |
| author2 |
Bell, D. C. Erdman, Natasha. ProQuest (Firm) |
| author_facet |
Bell, D. C. Erdman, Natasha. ProQuest (Firm) ProQuest (Firm) |
| author2_variant |
d c b dc dcb n e ne |
| author2_fuller |
(David C.) |
| author2_role |
TeilnehmendeR TeilnehmendeR TeilnehmendeR |
| author_corporate |
ProQuest (Firm) |
| author_sort |
Bell, D. C. |
| title |
Low voltage electron microscopy principles and applications / |
| spellingShingle |
Low voltage electron microscopy principles and applications / Royal Microscopical Society-John Wiley series |
| title_sub |
principles and applications / |
| title_full |
Low voltage electron microscopy [electronic resource] : principles and applications / edited by David C. Bell and Natasha Erdman. |
| title_fullStr |
Low voltage electron microscopy [electronic resource] : principles and applications / edited by David C. Bell and Natasha Erdman. |
| title_full_unstemmed |
Low voltage electron microscopy [electronic resource] : principles and applications / edited by David C. Bell and Natasha Erdman. |
| title_auth |
Low voltage electron microscopy principles and applications / |
| title_new |
Low voltage electron microscopy |
| title_sort |
low voltage electron microscopy principles and applications / |
| series |
Royal Microscopical Society-John Wiley series |
| series2 |
Royal Microscopical Society-John Wiley series |
| publisher |
John Wiley & Sons Inc., |
| publishDate |
2013 |
| physical |
xiii, 203 p., [14] p. of plates : ill. (some col.). |
| isbn |
9781118498507 (electronic bk.) |
| callnumber-first |
Q - Science |
| callnumber-subject |
QH - Natural History and Biology |
| callnumber-label |
QH212 |
| callnumber-sort |
QH 3212 E4 L69 42013 |
| genre |
Electronic books. |
| genre_facet |
Electronic books. |
| url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1120410 |
| illustrated |
Illustrated |
| dewey-hundreds |
500 - Science |
| dewey-tens |
500 - Science |
| dewey-ones |
502 - Miscellany |
| dewey-full |
502.8/25 |
| dewey-sort |
3502.8 225 |
| dewey-raw |
502.8/25 |
| dewey-search |
502.8/25 |
| oclc_num |
828299083 |
| work_keys_str_mv |
AT belldc lowvoltageelectronmicroscopyprinciplesandapplications AT erdmannatasha lowvoltageelectronmicroscopyprinciplesandapplications AT proquestfirm lowvoltageelectronmicroscopyprinciplesandapplications |
| status_str |
n |
| ids_txt_mv |
(MiAaPQ)5001120410 (Au-PeEL)EBL1120410 (CaPaEBR)ebr10657802 (CaONFJC)MIL450073 (OCoLC)828299083 |
| hierarchy_parent_title |
Royal Microscopical Society-John Wiley series |
| is_hierarchy_title |
Low voltage electron microscopy principles and applications / |
| container_title |
Royal Microscopical Society-John Wiley series |
| author2_original_writing_str_mv |
noLinkedField noLinkedField noLinkedField |
| _version_ |
1792330744903761921 |
| fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02068nam a2200397 a 4500</leader><controlfield tag="001">5001120410</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">121023s2013 njuadf sb 001 0 eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="z"> 2012033919</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9781119971115 (hardback)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118498507 (electronic bk.)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)5001120410</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL1120410</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr10657802</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL450073</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)828299083</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QH212.E4</subfield><subfield code="b">L69 2013</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">502.8/25</subfield><subfield code="2">23</subfield></datafield><datafield tag="245" ind1="0" ind2="0"><subfield code="a">Low voltage electron microscopy</subfield><subfield code="h">[electronic resource] :</subfield><subfield code="b">principles and applications /</subfield><subfield code="c">edited by David C. Bell and Natasha Erdman.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Hoboken :</subfield><subfield code="b">John Wiley & Sons Inc.,</subfield><subfield code="c">2013.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiii, 203 p., [14] p. of plates :</subfield><subfield code="b">ill. (some col.).</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Royal Microscopical Society-John Wiley series</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">"Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"--</subfield><subfield code="c">Provided by publisher.</subfield></datafield><datafield tag="533" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electron microscopy</subfield><subfield code="x">Technique.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bell, D. C.</subfield><subfield code="q">(David C.)</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Erdman, Natasha.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">RMS-Wiley series.</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1120410</subfield><subfield code="z">Click to View</subfield></datafield></record></collection> |