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Fringe pattern analysis for optical metrology : : theory, algorithms, and applications / / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.

Participants: Servin, Manuel, [ VerfasserIn ]; Quiroga, J. Antonio, [ VerfasserIn ]; Padilla, J. Moises, [ VerfasserIn ]; Quiroga, J. Antonio, [ TeilnehmendeR ]; Padilla, J. Moises, [ TeilnehmendeR ]
Published: 2014.

Other Authors: “...Padilla, J. Moises,...”

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