382 results:
371. Epitaxy-induced stresses as an efficient materials-design tool  
Dr. Martin Friak It is well known that epitaxial stress/strain conditions in thin films may result in stabilization of rather exotic and highly-distorted phases that would otherwise not exist in…  
372. Mechanical properties of thin films studied by bulge testing  
Dr. Benoit Merle Thin films are popular objects for investigating mechanical size effects. Most of the knowledge about freestanding films has been gathered from bulge tests and concerns the increase…  
373. Brittleness Transitions: Strength, Strain Rate, Structure and Scale  
W. Gerberich  
374. Precession Electron Diffraction Applications in TEM: from crystal structure determination to orientation imaging and strain mapping at nm scale  
V. Stelliou  
375. Real-time stress evolution during polycrystalline film growth: insights on the influence of adatom mobility and alloying  
G. Abadias  
376. Deformation in Ni-Nb metallic glassy film  
J. Jianzhong  
377. Innovative SEMs from TESCAN - The "Swiss knife" for complex sample analysis  
M. Petrenec, K. Klosovà, T. Hrncir, J. Dluhos  
378. Advanced Nanomechanical Testing Techniques  
Volinsky Alex  
379. Innovative methodologies for residual stress analysis at the micron-scale via FIB relaxation  
M. Sebastiani  
380. Materials analysis by use of modern X-ray diffraction techniques  
Pietsch Ullrich 3rd generation Synchrotron sources allow for spatial and time resolved measurements of materials. In this talk we present preliminary results of high-energy X-ray diffraction…  
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