Characterization of nanostructures by advanced (S)TEM techniques

Nowadays, a full structural and compositional analysis of all kind of materials is required since many properties, such as opto-electronic or catalytic activities, are related to the morphology and real composition and, therefore, potential applications can be identified. In this sense, the development of scanning-transmission electron microscopy (STEM) techniques is a powerful tool for such analysis, even high spatial and energy resolution. As an example of the progress in STEM techniques, three systems are analyzed using different techniques, from electron energy loss spectroscopy (EELS) and other analytical techniques to electron tomography for three-dimensional characterization of porous materials.